Integrated circuits - Very large scale integration - Testing - Congresses.
概要
| 作品: | 5 作品在 4 項出版品 4 種語言 | |
|---|---|---|
書目資訊
14th IEEE VLSI Test Symposium : = April 28-May 1, 1996, Princeton, New Jersey : proceedings /
by:
(書目-語言資料,印刷品)
VLSI design and test = 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /
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(書目-電子資源)
主題