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14th IEEE VLSI Test Symposium : = Ap...
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IEEE Computer Society., Test Technology Technical Committee.
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14th IEEE VLSI Test Symposium : = April 28-May 1, 1996, Princeton, New Jersey : proceedings /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
14th IEEE VLSI Test Symposium :/ sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
其他題名:
April 28-May 1, 1996, Princeton, New Jersey : proceedings /
其他題名:
Fourteenth IEEE VLSI Test Symposium
團體作者:
IEEE VLSI Test Symposium
出版者:
Los Alamitos, Calif. :IEEE Computer Society Press, : c1996.,
面頁冊數:
xxix, 510 p. :ill. ;28 cm.
附註:
"IEEE Computer Society Press order number PR07304"--T.p. verso.
標題:
Integrated circuits - Very large scale integration -
ISBN:
0818673044 (pbk.) :
14th IEEE VLSI Test Symposium : = April 28-May 1, 1996, Princeton, New Jersey : proceedings /
14th IEEE VLSI Test Symposium :
April 28-May 1, 1996, Princeton, New Jersey : proceedings /Fourteenth IEEE VLSI Test Symposiumsponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section. - Los Alamitos, Calif. :IEEE Computer Society Press,c1996. - xxix, 510 p. :ill. ;28 cm.
"IEEE Computer Society Press order number PR07304"--T.p. verso.
Includes bibliographical references and index.
ISBN: 0818673044 (pbk.) :US100.00
LCCN: 96075502Subjects--Topical Terms:
699885
Integrated circuits
--Very large scale integration
LC Class. No.: TK7874 / .I3274 1996
Dewey Class. No.: 621.39/5/0287
14th IEEE VLSI Test Symposium : = April 28-May 1, 1996, Princeton, New Jersey : proceedings /
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