VLSI design and test = 22nd Internat...
VDAT (Symposium) (2018 :)

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  • VLSI design and test = 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /
  • 紀錄類型: 書目-電子資源 : Monograph/item
    正題名/作者: VLSI design and test/ edited by S. Rajaram ... [et al.].
    其他題名: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /
    其他題名: VDAT 2018
    其他作者: Rajaram, S.
    團體作者: VDAT (Symposium)
    出版者: Singapore :Springer Singapore : : 2019.,
    面頁冊數: xviii, 722 p. :ill. (some col.), digital ;24 cm.
    內容註: Digital design -- Analog and mixed signal design -- Hardware security -- Micro bio-fluidics -- VLSI testing -- Analog circuits and devices -- Network-on-chip -- Memory -- Quantum computing and NoC -- Sensors and interfaces.
    Contained By: Springer eBooks
    標題: Integrated circuits - Very large scale integration -
    電子資源: https://doi.org/10.1007/978-981-13-5950-7
    ISBN: 9789811359507
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