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VLSI design and test = 23rd Internat...

VDAT (Symposium) (2019 :)

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VLSI design and test = 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019 : revised selected papers /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	VLSI design and test/ edited by Anirban Sengupta ... [et al.].
其他題名:	23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019 : revised selected papers /
其他題名:	VDAT 2019
其他作者:	Sengupta, Anirban.
團體作者:	VDAT (Symposium)
出版者:	Singapore :Springer Singapore : : 2019.,
面頁冊數:	xvi, 775 p. :ill., digital ;24 cm.
內容註:	Analog and Mixed Signal Design -- Computing Architecture and Security -- Hardware Design and Optimization -- Low Power VLSI and Memory Design. -Device Modelling -- Hardware Implementation.
Contained By:	Springer Nature eBook
標題:	Integrated circuits - Very large scale integration -
電子資源:	https://doi.org/10.1007/978-981-32-9767-8
ISBN:	9789813297678

VLSI design and test = 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019 : revised selected papers /
VLSI design and test23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019 : revised selected papers /[electronic resource] :VDAT 2019edited by Anirban Sengupta ... [et al.]. - Singapore :Springer Singapore :2019. - xvi, 775 p. :ill., digital ;24 cm. - Communications in computer and information science,10661865-0929 ;. - Communications in computer and information science ;1066..

Analog and Mixed Signal Design -- Computing Architecture and Security -- Hardware Design and Optimization -- Low Power VLSI and Memory Design. -Device Modelling -- Hardware Implementation.

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

ISBN: 9789813297678

Standard No.: 10.1007/978-981-32-9767-8doiSubjects--Topical Terms:

699885
Integrated circuits
--Very large scale integration

LC Class. No.: TK7874.75 / .V33 2019

Dewey Class. No.: 621.395

VLSI design and test = 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019 : revised selected papers /
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