Integrated circuits - Very large scale integration - Testing - Congresses.
Overview
| Works: | 5 works in 4 publications in 4 languages | |
|---|---|---|
Titles
14th IEEE VLSI Test Symposium : = April 28-May 1, 1996, Princeton, New Jersey : proceedings /
by:
(Language materials, printed)
VLSI design and test = 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017 : revised selected papers /
by:
(Electronic resources)
VLSI design and test = 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /
by:
(Electronic resources)
Subjects