Atomic force microscopy.
概要
| 作品: | 25 作品在 14 項出版品 14 種語言 | |
|---|---|---|
書目資訊
Surface analysis with STM and AFM : = experimental and theoretical aspects of image analysis /
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Kelvin probe force microscopy = from single charge detection to device characterization /
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The world of nano-biomechanics = mechanical imaging and measurement by atomic force microscopy /
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Atomic force microscopy in process engineering = introduction to AFM for improved processes and products /
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Ferroelectric domain walls = statics, dynamics, and functionalities revealed by atomic force microscopy /
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Scanning probe microscopy = atomic force microscopy and scanning tunneling microscopy /
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Investigations of cellular and molecular biophysical properties by atomic force microscopy nanorobotics
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