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Atomic force microscopy

Voigtlander, Bert.

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Atomic force microscopy

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Atomic force microscopy/ by Bert Voigtlander.
作者:	Voigtlander, Bert.
出版者:	Cham :Springer International Publishing : : 2019.,
面頁冊數:	xiv, 331 p. :ill., digital ;24 cm.
內容註:	Introduction -- Part I: Scanning Probe Microscopy Instrumentation -- Harmonic Oscillator -- Technical Aspects of Scanning Probe Microscopy -- Scanning Probe Microscopy Designs -- Electronics for Scanning Probe Microscopy -- Lock-In Technique -- Data Representation and Image Processing -- Artifacts in SPM -- Work Function, Contact Potential, and Kelvin Probe -- Part II: Atomic Force Microscopy (AFM) -- Forces between Tip and Sample -- Technical Aspects of Atomic Force Microscopy -- Static Atomic Force Microscopy -- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy -- Intermittent Contact Mode/Tapping Mode -- Mapping of Mechanical Properties Using Force-Distance -- Frequency Modulation (FM) Mode in Dynamic Atomic Force -- Noise in Atomic Force Microscopy -- Quartz Sensors in Atomic Force Microscopy.
Contained By:	Springer eBooks
標題:	Atomic force microscopy. -
電子資源:	https://doi.org/10.1007/978-3-030-13654-3
ISBN:	9783030136543

Atomic force microscopy
Voigtlander, Bert.

Atomic force microscopy[electronic resource] /by Bert Voigtlander. - 2nd ed. - Cham :Springer International Publishing :2019. - xiv, 331 p. :ill., digital ;24 cm. - Nanoscience and technology,1434-4904. - Nanoscience and technology..

Introduction -- Part I: Scanning Probe Microscopy Instrumentation -- Harmonic Oscillator -- Technical Aspects of Scanning Probe Microscopy -- Scanning Probe Microscopy Designs -- Electronics for Scanning Probe Microscopy -- Lock-In Technique -- Data Representation and Image Processing -- Artifacts in SPM -- Work Function, Contact Potential, and Kelvin Probe -- Part II: Atomic Force Microscopy (AFM) -- Forces between Tip and Sample -- Technical Aspects of Atomic Force Microscopy -- Static Atomic Force Microscopy -- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy -- Intermittent Contact Mode/Tapping Mode -- Mapping of Mechanical Properties Using Force-Distance -- Frequency Modulation (FM) Mode in Dynamic Atomic Force -- Noise in Atomic Force Microscopy -- Quartz Sensors in Atomic Force Microscopy.

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

ISBN: 9783030136543

Standard No.: 10.1007/978-3-030-13654-3doiSubjects--Topical Terms:

587940
Atomic force microscopy.

LC Class. No.: QH212.A78 / V654 2019

Dewey Class. No.: 620.5

Atomic force microscopy
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520 $a This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
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