紀錄類型: |
書目-電子資源
: Monograph/item
|
正題名/作者: |
Active probe atomic force microscopy/ by Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi. |
其他題名: |
a practical guide on precision instrumentation / |
作者: |
Xia, Fangzhou. |
其他作者: |
Rangelow, Ivo W. |
出版者: |
Cham :Springer International Publishing : : 2024., |
面頁冊數: |
xxiv, 366 p. :ill., digital ;24 cm. |
內容註: |
Introduction -- Active Probe Design and Fabrication -- Advanced Applications of Active Probes -- Atomic Force Microscope Designs -- AFM System using Active Probe -- A Low-cost AFM Design for Engineering Education -- Appendix. |
Contained By: |
Springer Nature eBook |
標題: |
Atomic force microscopy. - |
電子資源: |
https://doi.org/10.1007/978-3-031-44233-9 |
ISBN: |
9783031442339 |