Nicolici, Nicola.
Overview
Works: | 1 works in 0 publications in 0 languages |
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Titles
Power-constrained testing of VLSI circuits
by:
Al-Hashimi, Bashir.; NetLibrary, Inc.; Nicolici, Nicola.
(Language materials, printed)
Power-constrained testing of VLSI circuits
by:
Al-Hashimi, Bashir.; SpringerLink (Online service); Nicolici, Nicola.
(Language materials, printed)
Power-aware testing and test strategies for low power devices
by:
Girard, Patrick.; Nicolici, Nicola.; Wen, Xiaoqing.; SpringerLink (Online service)
(Language materials, printed)
Subjects
Integrated circuits- Very large scale integration
Semiconductors- Thermal properties.
Integrated circuits, Very large scale integration
Computer-Aided Engineering (CAD, CAE) and Design.
Circuits and Systems.
Low voltage integrated circuits- Power supply.
Low voltage integrated circuits- Testing.
Engineering.