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Power-constrained testing of VLSI ci...

Al-Hashimi, Bashir.

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Power-constrained testing of VLSI circuits

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Power-constrained testing of VLSI circuits/ by Nicola Nicolici and Bashir M. Al-Hashimi.
作者:	Nicolici, Nicola.
其他作者:	Al-Hashimi, Bashir.
出版者:	Boston :Kluwer Academic Publishers, : c2003.,
面頁冊數:	xi, 178 p. :ill. ;25 cm.
叢書名:	Frontiers in electronic testing ;
標題:	Integrated circuits - Very large scale integration -
電子資源:	http://www.netLibrary.com/urlapi.asp?action=summary&v=1&bookid=121056An electronic book accessible through the World Wide Web; click for information
ISBN:	0306487314 (electronic bk.)

Power-constrained testing of VLSI circuits
Nicolici, Nicola.

Power-constrained testing of VLSI circuits[electronic resource] /by Nicola Nicolici and Bashir M. Al-Hashimi. - Boston :Kluwer Academic Publishers,c2003. - xi, 178 p. :ill. ;25 cm. - Frontiers in electronic testing ;22.

Includes bibliographical references (p. 163-173) and index.

Electronic reproduction.
Boulder, Colo. :
NetLibrary,
2004.

Available via World Wide Web.

ISBN: 0306487314 (electronic bk.)Subjects--Topical Terms:

832269
Integrated circuits
--Very large scale integrationIndex Terms--Genre/Form:

542853
Electronic books.

LC Class. No.: TK7874.75 / .N53 2003eb

Dewey Class. No.: 621.39/5/0287

Power-constrained testing of VLSI circuits
LDR:01131cam a2200253 a 45 001 735544
003 OCoLC
005 20080324
006 m d
007 cr cnu---unuuu
008 080324s2003 maua sb 001 0 eng d
020 $a 0306487314 (electronic bk.)
035 $a ocm56884217
040 $a N $c N $d OCLCQ
049 $a AMFA
050 1 4 $a TK7874.75 $b .N53 2003eb
082 0 4 $a 621.39/5/0287 $2 22
100 $a Nicolici, Nicola. $3 832268
245 1 0 $a Power-constrained testing of VLSI circuits $h [electronic resource] / $c by Nicola Nicolici and Bashir M. Al-Hashimi.
260 $a Boston : $c c2003. $b Kluwer Academic Publishers,
300 $a xi, 178 p. : $b ill. ; $c 25 cm.
440 0 $a Frontiers in electronic testing ; $v 22
504 $a Includes bibliographical references (p. 163-173) and index.
533 $a Electronic reproduction. $b Boulder, Colo. : $c NetLibrary, $d 2004. $n Available via World Wide Web. $n Access may be limited to NetLibrary affiliated libraries. $n Series number does not appear on ebook.
650 $a Integrated circuits $x Very large scale integration $x Protection. $3 832269
650 $a Integrated circuits $x Very large scale integration $x Testing. $3 629092
650 $a Semiconductors $x Thermal properties. $3 668415
655 $a Electronic books. $2 lcsh $3 542853
700 $a Al-Hashimi, Bashir. $3 832267
710 $a NetLibrary, Inc. $3 542851
856 4 0 $3 Bibliographic record display $u http://www.netLibrary.com/urlapi.asp?action=summary&v=1&bookid=121056 $z An electronic book accessible through the World Wide Web; click for information
994 $a 92 $b AMF