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Power-constrained testing of VLSI ci...
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Al-Hashimi, Bashir.
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Power-constrained testing of VLSI circuits
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Power-constrained testing of VLSI circuits/ by Nicola Nicolici and Bashir M. Al-Hashimi.
作者:
Nicolici, Nicola.
其他作者:
Al-Hashimi, Bashir.
出版者:
Boston :Springer Science + Business Media, : c2004.,
面頁冊數:
xi, 178 p. :ill., digital ;25 cm.
叢書名:
Frontiers in electronic testing ;
Contained By:
Springer e-books
標題:
Integrated circuits, Very large scale integration - Protection. -
電子資源:
http://dx.doi.org/10.1007/b105922
ISBN:
9780306487316 (electronic bk.)
Power-constrained testing of VLSI circuits
Nicolici, Nicola.
Power-constrained testing of VLSI circuits
[electronic resource] /by Nicola Nicolici and Bashir M. Al-Hashimi. - Boston :Springer Science + Business Media,c2004. - xi, 178 p. :ill., digital ;25 cm. - Frontiers in electronic testing ;22.
ISBN: 9780306487316 (electronic bk.)Subjects--Topical Terms:
1005099
Integrated circuits, Very large scale integration
--Protection.
LC Class. No.: TK7874.75 / .N53 2004
Dewey Class. No.: 621.3950287
Power-constrained testing of VLSI circuits
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