東華大學圖書館 |

Integrated circuits - Very large scale integration - Testing.

Overview

Works:	13 works in 4 publications in 4 languages

Titles

System-on-chip test architectures : = nanometer design for testability / by: (Language materials, printed)

IDDQ testing of VLSI circuits / by: (Language materials, printed)

System-on-chip test architectures = nanometer design for testability / by: (Language materials, printed)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / by: (Language materials, printed)

Power-constrained testing of VLSI circuits by: (Language materials, printed)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits by: (Language materials, printed)

VLSI test principles and architectures : = design for testability / by: (Language materials, printed)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits by: (Language materials, printed)

VLSI test principles and architectures = design for testability / by: (Electronic resources)

Debug automation from pre-silicon to post-silicon by: (Electronic resources)