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Essentials of electronic testing for...
~
Agrawal, Vishwani D., (1943-.)
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits // Michael L. Bushnell, Vishwani D. Agrawal.
作者:
Bushnell, Michael L.
其他作者:
Agrawal, Vishwani D.,
出版者:
Boston :Kluwer Academic, : c2000.,
面頁冊數:
xviii, 690 p. :ill. ;26 cm.
叢書名:
Frontiers in electronic testing ;
標題:
Digital integrated circuits - Testing. -
ISBN:
0792379918 :
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
Bushnell, Michael L.1950-.
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
Michael L. Bushnell, Vishwani D. Agrawal. - Boston :Kluwer Academic,c2000. - xviii, 690 p. :ill. ;26 cm. - Frontiers in electronic testing ;17..
Includes bibliographical references (p. [631]-670) and index.
ISBN: 0792379918 :EUR154.50
LCCN: 00046212Subjects--Topical Terms:
752574
Digital integrated circuits
--Testing.
LC Class. No.: TK7874.75 / .B87 2000
Dewey Class. No.: 621.39/5
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
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