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Rangelow, Ivo W.

Overview

Works:	1 works in 1 publications in 1 languages

Titles

Active probe atomic force microscopy = a practical guide on precision instrumentation / by: Xia, Fangzhou.; Rangelow, Ivo W.; Youcef-Toumi, Kamal.; SpringerLink (Online service) (Electronic resources)

Subjects

Mechatronics. Electronics and Microelectronics, Instrumentation. Spectroscopy. Microsystems and MEMS. Atomic force microscopy. Measurement Science and Instrumentation.

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