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Lock-in thermography = basics and us...

Breitenstein, Otwin.

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Lock-in thermography = basics and use for evaluating electronic devices and materials /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Lock-in thermography/ by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp.
其他題名:	basics and use for evaluating electronic devices and materials /
作者:	Breitenstein, Otwin.
其他作者:	Langenkamp, Martin.
出版者:	Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg, : 2010.,
面頁冊數:	x, 255 p. :ill., digital ;24 cm.
叢書名:	Springer series in advanced microelectronics,
Contained By:	Springer eBooks
標題:	Electronic apparatus and appliances - Testing. -
電子資源:	http://dx.doi.org/10.1007/978-3-642-02417-7
ISBN:	9783642024160 (paper)

Lock-in thermography = basics and use for evaluating electronic devices and materials /
Breitenstein, Otwin.

Lock-in thermographybasics and use for evaluating electronic devices and materials /[electronic resource] :by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp. - 2nd ed. - Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2010. - x, 255 p. :ill., digital ;24 cm. - Springer series in advanced microelectronics,101437-0387 ;.

ISBN: 9783642024160 (paper)Subjects--Topical Terms:

672198
Electronic apparatus and appliances
--Testing.

LC Class. No.: TK7870.25 / .B74 2010

Dewey Class. No.: 621.381548

Lock-in thermography = basics and use for evaluating electronic devices and materials /
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