Langenkamp, Martin.
概要
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書目資訊
Lock-in thermography = basics and use for evaluating electronic devices and materials /
by:
Breitenstein, Otwin.; Langenkamp, Martin.; Warta, Wilhelm.; SpringerLink (Online service)
(書目-語言資料,印刷品)
主題
Thermography.
Semiconductors- Thermal properties.
Electronic apparatus and appliances- Testing.
Optics, Optoelectronics, Plasmonics and Optical Devices.
Structural Materials.
Physics.
Characterization and Evaluation of Materials.
Engineering, general.
Electronic apparatus and appliances- Thermal properties.