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Field emission scanning electron mic...

Brodusch, Nicolas.

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Field emission scanning electron microscopy = new perspectives for materials characterization /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Field emission scanning electron microscopy/ by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin.
其他題名:	new perspectives for materials characterization /
作者:	Brodusch, Nicolas.
其他作者:	Demers, Hendrix.
出版者:	Singapore :Springer Singapore : : 2018.,
面頁冊數:	xii, 137 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	Scanning electron microscopy. -
電子資源:	http://dx.doi.org/10.1007/978-981-10-4433-5
ISBN:	9789811044335

Field emission scanning electron microscopy = new perspectives for materials characterization /
Brodusch, Nicolas.

Field emission scanning electron microscopynew perspectives for materials characterization /[electronic resource] :by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin. - Singapore :Springer Singapore :2018. - xii, 137 p. :ill., digital ;24 cm. - SpringerBriefs in applied sciences and technology,2191-530X. - SpringerBriefs in applied sciences and technology..

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage.

ISBN: 9789811044335

Standard No.: 10.1007/978-981-10-4433-5doiSubjects--Topical Terms:

551366
Scanning electron microscopy.

LC Class. No.: TA417.23 / .B76 2018

Dewey Class. No.: 502.825

Field emission scanning electron microscopy = new perspectives for materials characterization /
LDR:01856nmm a2200313 a 4500 001 2131087
003 DE-He213
005 20180530172743.0
006 m d
007 cr nn 008maaau
008 181005s2018 si s 0 eng d
020 $a 9789811044335 $q (electronic bk.)
020 $a 9789811044328 $q (paper)
024 7 $a 10.1007/978-981-10-4433-5 $2 doi
035 $a 978-981-10-4433-5
040 $a GP $c GP
041 0 $a eng
050 4 $a TA417.23 $b .B76 2018
072 7 $a TGMT $2 bicssc
072 7 $a TEC021000 $2 bisacsh
082 0 4 $a 502.825 $2 23
090 $a TA417.23 $b .B864 2018
100 1 $a Brodusch, Nicolas. $3 3296282
245 1 0 $a Field emission scanning electron microscopy $h [electronic resource] : $b new perspectives for materials characterization / $c by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin.
260 $a Singapore : $b Springer Singapore : $b Imprint: Springer, $c 2018.
300 $a xii, 137 p. : $b ill., digital ; $c 24 cm.
490 1 $a SpringerBriefs in applied sciences and technology, $x 2191-530X
520 $a This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage.
650 0 $a Scanning electron microscopy. $3 551366
650 0 $a Materials $x Testing. $3 601009
650 1 4 $a Materials Science. $3 890867
650 2 4 $a Characterization and Evaluation of Materials. $3 890988
650 2 4 $a Spectroscopy and Microscopy. $3 1066375
650 2 4 $a Nanotechnology and Microengineering. $3 1005737
700 1 $a Demers, Hendrix. $3 3296283
700 1 $a Gauvin, Raynald. $3 3296284
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer eBooks
830 0 $a SpringerBriefs in applied sciences and technology. $3 1565541
856 4 0 $u http://dx.doi.org/10.1007/978-981-10-4433-5
950 $a Chemistry and Materials Science (Springer-11644)