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Seeking modernity, brain gain, and b...
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Luo, Di.
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Seeking modernity, brain gain, and brain drain: The historical evolution of Chinese students' overseas education in the United States since modern China.
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Seeking modernity, brain gain, and brain drain: The historical evolution of Chinese students' overseas education in the United States since modern China./
Author:
Luo, Di.
Description:
47 p.
Notes:
Source: Masters Abstracts International, Volume: 52-04.
Contained By:
Masters Abstracts International52-04(E).
Subject:
Education, Policy. -
Online resource:
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=1551171
ISBN:
9781303680632
Seeking modernity, brain gain, and brain drain: The historical evolution of Chinese students' overseas education in the United States since modern China.
Luo, Di.
Seeking modernity, brain gain, and brain drain: The historical evolution of Chinese students' overseas education in the United States since modern China.
- 47 p.
Source: Masters Abstracts International, Volume: 52-04.
Thesis (M.A.)--Loyola University Chicago, 2013.
This thesis is an historical research project that examines major waves of Chinese students studying in the United States since the mid-nineteenth century, as well as the impact of returned, American-educated Chinese students to the modernization of Chinese society. It also discusses the trend and pattern of the current wave after 1978 and compare it with previous waves. The analysis and examination of this thesis is based on a wide variety of written documents in both Chinese and English, including historical literatures, academic articles, dissertations, surveys, government publications, statistical data from both primary and secondary sources, as well as educational organization records.
ISBN: 9781303680632Subjects--Topical Terms:
1669130
Education, Policy.
Seeking modernity, brain gain, and brain drain: The historical evolution of Chinese students' overseas education in the United States since modern China.
LDR
:01598nam a2200265 4500
001
1966397
005
20141125142246.5
008
150210s2013 ||||||||||||||||| ||eng d
020
$a
9781303680632
035
$a
(MiAaPQ)AAI1551171
035
$a
AAI1551171
040
$a
MiAaPQ
$c
MiAaPQ
100
1
$a
Luo, Di.
$3
2103215
245
1 0
$a
Seeking modernity, brain gain, and brain drain: The historical evolution of Chinese students' overseas education in the United States since modern China.
300
$a
47 p.
500
$a
Source: Masters Abstracts International, Volume: 52-04.
500
$a
Adviser: Noah W. Sobe.
502
$a
Thesis (M.A.)--Loyola University Chicago, 2013.
520
$a
This thesis is an historical research project that examines major waves of Chinese students studying in the United States since the mid-nineteenth century, as well as the impact of returned, American-educated Chinese students to the modernization of Chinese society. It also discusses the trend and pattern of the current wave after 1978 and compare it with previous waves. The analysis and examination of this thesis is based on a wide variety of written documents in both Chinese and English, including historical literatures, academic articles, dissertations, surveys, government publications, statistical data from both primary and secondary sources, as well as educational organization records.
590
$a
School code: 0112.
650
4
$a
Education, Policy.
$3
1669130
690
$a
0458
710
2 0
$a
Loyola University Chicago.
$b
Education.
$3
1673468
773
0
$t
Masters Abstracts International
$g
52-04(E).
790
$a
0112
791
$a
M.A.
792
$a
2013
793
$a
English
856
4 0
$u
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=1551171
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