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Kelvin probe force microscopy = meas...

Sadewasser, Sascha.

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Kelvin probe force microscopy = measuring and compensating electrostatic forces /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Kelvin probe force microscopy/ edited by Sascha Sadewasser, Thilo Glatzel.{me_controlnum}
其他題名:	measuring and compensating electrostatic forces /
其他作者:	Sadewasser, Sascha.
出版者:	Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg, : 2012.,
面頁冊數:	xiv, 331 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	Atomic force microscopy. -
電子資源:	http://dx.doi.org/10.1007/978-3-642-22566-6
ISBN:	9783642225666 (electronic bk.)

Kelvin probe force microscopy = measuring and compensating electrostatic forces /
Kelvin probe force microscopymeasuring and compensating electrostatic forces /[electronic resource] :edited by Sascha Sadewasser, Thilo Glatzel.{me_controlnum} - Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2012. - xiv, 331 p. :ill., digital ;24 cm. - Springer series in surface sciences,480931-5195 ;. - Springer series in surface sciences ;48..

ISBN: 9783642225666 (electronic bk.)Subjects--Topical Terms:

587940
Atomic force microscopy.

LC Class. No.: QH212.A78 / K45 2012

Dewey Class. No.: 502.825

Kelvin probe force microscopy = measuring and compensating electrostatic forces /
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