語系
Sadewasser, Sascha.
概要
| 作品: | 0 作品在 2 項出版品 1 種語言 | |
|---|---|---|
書目資訊
Kelvin probe force microscopy = measuring and compensating electrostatic forces /
by:
Sadewasser, Sascha.; Glatzel, Thilo.; SpringerLink (Online service)
(書目-電子資源)
Kelvin probe force microscopy = from single charge detection to device characterization /
by:
Sadewasser, Sascha.; Glatzel, Thilo.; SpringerLink (Online service)
(書目-電子資源)
主題
Electrostatics- Measurement.
Surfaces and Interfaces, Thin Films.
Thermodynamics.
Spectroscopy and Microscopy.
Atomic force microscopy.
Materials Science.
Measurement Science and Instrumentation.
Nanotechnology and Microengineering.
Engineering Thermodynamics, Heat and Mass Transfer.
Scanning probe microscopy.
Physics.
Characterization and Evaluation of Materials.