Optical pattern recognition - Congresses.
Overview
Works: | 16 works in 16 publications in 16 languages |
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Titles
Advances in brain inspired cognitive systems = 5th International Conference, BICS 2012, Shenyang, China, July 11-14, 2012. Proceedings /
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(Electronic resources)
Transactions on data hiding and multimedia security VIII = special issue on pattern recognition for IT security /
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(Electronic resources)
Progress in pattern recognition, image analysis, computer vision, and applications = 17th Iberoamerican Congress, CIARP 2012, Buenos Aires, Argentina, September 3-6, 2012. Proceedings /
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(Electronic resources)
Pattern recognition = Chinese Conference, CCPR 2012, Beijing, China, September 24-26, 2012 : proceedings /
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(Electronic resources)
Graphics recognition = current trends and challenges : 10th International Workshop, GREC 2013, Bethlehem, PA, USA, August 20-21, 2013 : revised selected papers /
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(Electronic resources)
Pattern recognition and image analysis = 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015 : proceedings /
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(Language materials, printed)
Progress in pattern recognition, image analysis, computer vision, and applications = 20th Iberoamerican Congress, CIARP 2015, Montevideo, Uruguay, November 9-12, 2015 : proceedings /
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(Electronic resources)
Advanced concepts for intelligent vision systems = 14th International Conference, ACIVS 2012, Brno, Czech Republic, September 4-7, 2012 : proceedings /
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(Electronic resources)
Image analysis and recognition = 11th International Conference, ICIAR 2014, Vilamoura, Portugal, October 22-24, 2014 : proceedings.. Part II /
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(Electronic resources)
Image analysis and recognition = 11th International Conference, ICIAR 2014, Vilamoura, Portugal, October 22-24, 2014 : proceedings.. Part I /
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(Electronic resources)
Progress in pattern recognition, image analysis, computer vision, and applications = 19th Iberoamerican Congress, CIARP 2014, Puerto Vallarta, Mexico, November 2-5, 2014 : proceedings /
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(Electronic resources)
Video analytics for audience measurement = First International Workshop, VAAM 2014, Stockholm, Sweden, August 24, 2014 : revised selected papers /
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(Electronic resources)
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