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Progress in pattern recognition, ima...

Pardo, Alvaro.

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Progress in pattern recognition, image analysis, computer vision, and applications = 20th Iberoamerican Congress, CIARP 2015, Montevideo, Uruguay, November 9-12, 2015 : proceedings /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Progress in pattern recognition, image analysis, computer vision, and applications/ edited by Alvaro Pardo, Josef Kittler.
其他題名:	20th Iberoamerican Congress, CIARP 2015, Montevideo, Uruguay, November 9-12, 2015 : proceedings /
其他題名:	CIARP 2015
其他作者:	Pardo, Alvaro.
出版者:	Cham :Springer International Publishing : : 2015.,
面頁冊數:	xxi, 787 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	Pattern recognition systems -
電子資源:	http://dx.doi.org/10.1007/978-3-319-25751-8
ISBN:	9783319257518

Progress in pattern recognition, image analysis, computer vision, and applications = 20th Iberoamerican Congress, CIARP 2015, Montevideo, Uruguay, November 9-12, 2015 : proceedings /
Progress in pattern recognition, image analysis, computer vision, and applications20th Iberoamerican Congress, CIARP 2015, Montevideo, Uruguay, November 9-12, 2015 : proceedings /[electronic resource] :CIARP 2015edited by Alvaro Pardo, Josef Kittler. - Cham :Springer International Publishing :2015. - xxi, 787 p. :ill., digital ;24 cm. - Lecture notes in computer science,94230302-9743 ;. - Lecture notes in computer science ;5353..

This book constitutes the refereed proceedings of the 20th Iberoamerican Congress on Pattern Recognition, CIARP 2015, held in Montevideo, Uruguay, in November 2015. The 95 papers presented were carefully reviewed and selected from 185 submissions. The papers are organized in topical sections on applications on pattern recognition; biometrics; computer vision; gesture recognition; image classification and retrieval; image coding, processing and analysis; segmentation, analysis of shape and texture; signals analysis and processing; theory of pattern recognition; video analysis, segmentation and tracking.

ISBN: 9783319257518

Standard No.: 10.1007/978-3-319-25751-8doiSubjects--Topical Terms:

714332
Pattern recognition systems

LC Class. No.: Q337.5

Dewey Class. No.: 006.4

Progress in pattern recognition, image analysis, computer vision, and applications = 20th Iberoamerican Congress, CIARP 2015, Montevideo, Uruguay, November 9-12, 2015 : proceedings /
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