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Charge loss correction and inter-str...
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Hayward, Jason P.
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Charge loss correction and inter-strip interpolation in a high-purity germanium double-sided strip detector.
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Charge loss correction and inter-strip interpolation in a high-purity germanium double-sided strip detector./
作者:
Hayward, Jason P.
面頁冊數:
163 p.
附註:
Adviser: David K. Wehe.
Contained By:
Dissertation Abstracts International69-03B.
標題:
Engineering, Nuclear. -
電子資源:
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3304979
ISBN:
9780549511069
Charge loss correction and inter-strip interpolation in a high-purity germanium double-sided strip detector.
Hayward, Jason P.
Charge loss correction and inter-strip interpolation in a high-purity germanium double-sided strip detector.
- 163 p.
Adviser: David K. Wehe.
Thesis (Ph.D.)--University of Michigan, 2008.
One fundamental design issue in the HPGe double-sided strip detector is the gap between strips, which makes up 1/6 of the 3 mm strip pitch in the UM detector. While a wide gap between strips reduces noise, thereby improving energy resolution, it also results in measurable charge loss in the UM detector. Charge loss on either detector side for a single interaction in a Compton sequence may eliminate that sequence from being included in image reconstruction. Furthermore, use of the signals obtained for interactions that occur in gaps is complicated by: (1) their sensitivity to the change in charge cloud geometries and; (2) the difficulty of distinguishing single interactions from multiple close interactions.
ISBN: 9780549511069Subjects--Topical Terms:
1043651
Engineering, Nuclear.
Charge loss correction and inter-strip interpolation in a high-purity germanium double-sided strip detector.
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One fundamental design issue in the HPGe double-sided strip detector is the gap between strips, which makes up 1/6 of the 3 mm strip pitch in the UM detector. While a wide gap between strips reduces noise, thereby improving energy resolution, it also results in measurable charge loss in the UM detector. Charge loss on either detector side for a single interaction in a Compton sequence may eliminate that sequence from being included in image reconstruction. Furthermore, use of the signals obtained for interactions that occur in gaps is complicated by: (1) their sensitivity to the change in charge cloud geometries and; (2) the difficulty of distinguishing single interactions from multiple close interactions.
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In this work, methods for charge loss correction and inter-strip interpolation are described for interactions which fall in detector gaps. Over the energy range 60--1274 keV, charge loss correction increases photopeak counts by 15% on the anode side and 5% on the cathode side. Charge loss correction can be accomplished nearly as well when a second interaction falls beneath an adjacent strip. Inter-strip interpolation is able to determine the locations of these recovered events, yielding interaction position with lateral resolution of ∼l60 mum FWHM at 356 keV and ∼310 mum FWHM at 662 keV. According to simulation, lateral resolution in the gap is fundamentally limited to these values due to charge cloud size, and lateral resolution < 100 mum FWHM may be achieved at 200 keV. When a second interaction falls beneath an adjacent strip, lateral resolution for the gap interaction is still finer than the width of the gap and simulation shows potential for further improvement. These methods are suitable for real-time imaging applications, and they may be applied to other strip detector designs.
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