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Structural, syntactic, and statistic...

Hancock, Edwin R.

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Structural, syntactic, and statistical pattern recognition = Joint IAPR International Workshop, SSPR&SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010, proceedings /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Structural, syntactic, and statistical pattern recognition/ edited by Edwin R. Hancock ... [et al.].
Reminder of title:	Joint IAPR International Workshop, SSPR&SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010, proceedings /
remainder title:	SSPR & SPR 2010
other author:	Hancock, Edwin R.
Published:	Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg, : 2010.,
Description:	xv, 758 p. :ill., digital ;24 cm.
Series:	Lecture notes in computer science,
Contained By:	Springer eBooks
Subject:	Pattern perception - Congresses. -
Online resource:	http://dx.doi.org/10.1007/978-3-642-14980-1
ISBN:	9783642149795 (paper)

Structural, syntactic, and statistical pattern recognition = Joint IAPR International Workshop, SSPR&SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010, proceedings /
Structural, syntactic, and statistical pattern recognitionJoint IAPR International Workshop, SSPR&SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010, proceedings /[electronic resource] :SSPR & SPR 2010edited by Edwin R. Hancock ... [et al.]. - Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2010. - xv, 758 p. :ill., digital ;24 cm. - Lecture notes in computer science,62180302-9743 ;.

ISBN: 9783642149795 (paper)Subjects--Topical Terms:

1244093
Pattern perception
--Congresses.

LC Class. No.: Q327 / .S77 2010

Dewey Class. No.: 006.4

Structural, syntactic, and statistical pattern recognition = Joint IAPR International Workshop, SSPR&SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010, proceedings /
LDR:00939nam 2200241 a 45 001 922911
003 Springer
005 20110408
006 m d
007 cr nn 008maaau
008 110408s2010 gw s j eng d
020 $a 9783642149795 (paper)
020 $a 9783642149801 (electronic bk.)
035 $a 978-3-642-14979-5
050 0 4 $a Q327 $b .S77 2010
082 0 4 $a 006.4 $2 22
245 1 0 $a Structural, syntactic, and statistical pattern recognition $h [electronic resource] : $b Joint IAPR International Workshop, SSPR&SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010, proceedings / $c edited by Edwin R. Hancock ... [et al.].
246 3 $a SSPR & SPR 2010
260 $a Berlin, Heidelberg : $b Springer-Verlag Berlin Heidelberg, $c 2010.
300 $a xv, 758 p. : $b ill., digital ; $c 24 cm.
440 0 $a Lecture notes in computer science, $x 0302-9743 ; $v 6218
650 0 $a Pattern perception $v Congresses. $3 1244093
650 1 4 $a Computer Science. $3 626642
650 2 4 $a Algorithm Analysis and Problem Complexity. $3 891007
650 2 4 $a Artificial Intelligence (incl. Robotics) $3 890894
650 2 4 $a Data Mining and Knowledge Discovery. $3 898250
650 2 4 $a Database Management. $3 891010
650 2 4 $a Information Storage and Retrieval. $3 761906
650 2 4 $a Information Systems Applications (incl.Internet) $3 891011
700 1 $a Hancock, Edwin R. $3 700281
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-3-642-14980-1
950 $a Computer Science (Springer-11645)