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Developments in applied artificial i...

Ali, Moonis.

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Developments in applied artificial intelligence = 16th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 2003, Loughborough, UK, June 23-26, 2003 : proceedings /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Developments in applied artificial intelligence/ Paul W.H. Chung, Chris Hinde, Moonis Ali, eds.
其他題名:	16th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 2003, Loughborough, UK, June 23-26, 2003 : proceedings /
其他作者:	Ali, Moonis.
團體作者:	International Conference on Industrial & Engineering Applications of Artificial Intelligence & Expert Systems
出版者:	Berlin ;Springer, : c2003.,
面頁冊數:	xiv, 817 p. :ill., digital ;24 cm.
叢書名:	Lecture notes in computer science
Contained By:	Springer e-books
標題:	Artificial intelligence - Industrial applications -
電子資源:	http://dx.doi.org/10.1007/3-540-45034-3
ISBN:	9783540404552 (paper)

Developments in applied artificial intelligence = 16th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 2003, Loughborough, UK, June 23-26, 2003 : proceedings /
Developments in applied artificial intelligence16th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 2003, Loughborough, UK, June 23-26, 2003 : proceedings /[electronic resource] :Paul W.H. Chung, Chris Hinde, Moonis Ali, eds. - Berlin ;Springer,c2003. - xiv, 817 p. :ill., digital ;24 cm. - Lecture notes in computer scienceLecture notes in artificial intelligence,2718.0302-9743 ;.

ISBN: 9783540404552 (paper)Subjects--Topical Terms:

704827
Artificial intelligence
--Industrial applications

LC Class. No.: Q334 / .I556 2003

Dewey Class. No.: 670.28563

Developments in applied artificial intelligence = 16th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 2003, Loughborough, UK, June 23-26, 2003 : proceedings /
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