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VLSI test principles and architectures : = design for testability /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
VLSI test principles and architectures :/ edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
其他題名:
design for testability /
其他作者:
Wang, Laung-Terng.
出版者:
Amsterdam, The Netherlands ;Elsevier Morgan Kaufmann Publishers, : c2006.,
面頁冊數:
xxx, 777 p. :ill. ;25 cm.
叢書名:
The Morgan Kaufmann series in systems on silicon.
標題:
Integrated circuits - Very large scale integration -
ISBN:
0123705975 (hbk.) :
VLSI test principles and architectures : = design for testability /
VLSI test principles and architectures :
design for testability /edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. - Amsterdam, The Netherlands ;Elsevier Morgan Kaufmann Publishers,c2006. - xxx, 777 p. :ill. ;25 cm. - The Morgan Kaufmann series in systems on silicon..
Includes bibliographical references and index.
ISBN: 0123705975 (hbk.) :NT1350Subjects--Topical Terms:
629092
Integrated circuits
--Very large scale integration
LC Class. No.: TK7874.75 / .V587 2006
Dewey Class. No.: 621.39/5
VLSI test principles and architectures : = design for testability /
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