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Lifetime Spectroscopy = A Method of ...

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Lifetime Spectroscopy = A Method of Defect Characterization in Silicon for Photovoltaic Applications /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Lifetime Spectroscopy/ by Stefan Rein.
其他題名:	A Method of Defect Characterization in Silicon for Photovoltaic Applications /
作者:	Rein, Stefan.
出版者:	Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg, : 2005.,
面頁冊數:	xxvi, 489 p. :ill., digital ;25 cm.
叢書名:	Springer Series in Material Science,
Contained By:	Springer e-books
標題:	Silicon crystals - Defects. -
電子資源:	http://dx.doi.org/10.1007/3-540-27922-9http://dx.doi.org/10.1007/3-540-27922-9
ISBN:	9783540253037 (paper)

Lifetime Spectroscopy = A Method of Defect Characterization in Silicon for Photovoltaic Applications /
Rein, Stefan.

Lifetime SpectroscopyA Method of Defect Characterization in Silicon for Photovoltaic Applications /[electronic resource] :by Stefan Rein. - Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2005. - xxvi, 489 p. :ill., digital ;25 cm. - Springer Series in Material Science,850933-033X ;.

ISBN: 9783540253037 (paper)Subjects--Topical Terms:

897961
Silicon crystals
--Defects.

LC Class. No.: TK7871.15.S55 / R45 2005

Dewey Class. No.: 537

Lifetime Spectroscopy = A Method of Defect Characterization in Silicon for Photovoltaic Applications /
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