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Essentials of electronic testing for...

Agrawal, Vishwani D., (1943-)

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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits/ Michael L. Bushnell, Vishwani D. Agrawal.
作者:	Bushnell, Michael L.
其他作者:	Agrawal, Vishwani D.,
出版者:	Boston :Kluwer Academic, : c2000.,
面頁冊數:	xviii, 690 p. :ill. ;26 cm.
叢書名:	Frontiers in electronic testing ;
標題:	Digital integrated circuits - Testing. -
電子資源:	http://www.netLibrary.com/urlapi.asp?action=summary&v=1&bookid=71183An electronic book accessible through the World Wide Web; click for information
ISBN:	0306470403 (electronic bk.)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Bushnell, Michael L.1950-

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits[electronic resource] /Michael L. Bushnell, Vishwani D. Agrawal. - Boston :Kluwer Academic,c2000. - xviii, 690 p. :ill. ;26 cm. - Frontiers in electronic testing ;17.

Includes bibliographical references (p. [631]-670) and index.

Electronic reproduction.
Boulder, Colo. :
NetLibrary,
2002.

Available via World Wide Web.

ISBN: 0306470403 (electronic bk.)Subjects--Topical Terms:

752574
Digital integrated circuits
--Testing.Index Terms--Genre/Form:

542853
Electronic books.

LC Class. No.: TK7874.75 / .B87 2000eb

Dewey Class. No.: 621.39/5

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
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003 OCoLC
005 20071228
006 m d
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008 071228s2000 maua sb 001 0 eng d
020 $a 0306470403 (electronic bk.)
035 $a ocm50767274
040 $a N $c N
049 $a AMFA
050 1 4 $a TK7874.75 $b .B87 2000eb
082 0 4 $a 621.39/5 $2 21
100 $a Bushnell, Michael L. $q (Michael Lee), $d 1950- $3 868745
245 1 0 $a Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits $h [electronic resource] / $c Michael L. Bushnell, Vishwani D. Agrawal.
260 $a Boston : $c c2000. $b Kluwer Academic,
300 $a xviii, 690 p. : $b ill. ; $c 26 cm.
440 0 $a Frontiers in electronic testing ; $v 17
504 $a Includes bibliographical references (p. [631]-670) and index.
533 $a Electronic reproduction. $b Boulder, Colo. : $c NetLibrary, $d 2002. $n Available via World Wide Web. $n Access may be limited to NetLibrary affiliated libraries.
650 $a Digital integrated circuits $x Testing. $3 752574
650 $a Integrated circuits $x Very large scale integration $x Testing. $3 629092
650 $a Mixed signal circuits $x Testing. $3 752575
650 $a Semiconductor storage devices $x Testing. $3 752576
655 $a Electronic books. $2 lcsh $3 542853
700 $a Agrawal, Vishwani D., $d 1943- $3 660161
710 $a NetLibrary, Inc. $3 542851
856 4 $3 Bibliographic record display $u http://www.netLibrary.com/urlapi.asp?action=summary&v=1&bookid=71183 $z An electronic book accessible through the World Wide Web; click for information
994 $a 92 $b AMF