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Beam effects, surface topography, an...

Czanderna, Alvin Warren, (1930-)

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Beam effects, surface topography, and depth profiling in surface analysis

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Beam effects, surface topography, and depth profiling in surface analysis/ edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell.
其他作者:	Czanderna, Alvin Warren,
出版者:	New York :Kluwer Academic, : c2002.,
面頁冊數:	xix, 430 p. :ill. ;24 cm.
叢書名:	Methods of surface characterization ;
標題:	Materials - Effect of radiation on. -
電子資源:	http://www.netLibrary.com/urlapi.asp?action=summary&v=1&bookid=67545An electronic book accessible through the World Wide Web; click for information
ISBN:	0306469146 (electronic bk.)

Beam effects, surface topography, and depth profiling in surface analysis
Beam effects, surface topography, and depth profiling in surface analysis[electronic resource] /edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell. - New York :Kluwer Academic,c2002. - xix, 430 p. :ill. ;24 cm. - Methods of surface characterization ;v. 5.

Includes bibliographical references and index.

Electronic reproduction.
Boulder, Colo. :
NetLibrary,
2002.

Available via World Wide Web.

ISBN: 0306469146 (electronic bk.)Subjects--Topical Terms:

673011
Materials
--Effect of radiation on.Index Terms--Genre/Form:

542853
Electronic books.

LC Class. No.: TA418.7 / .B43 2002eb

Dewey Class. No.: 620/.44

Beam effects, surface topography, and depth profiling in surface analysis
LDR:01162cam a2200265 a 45 001 751556
003 OCoLC
005 20071228
006 m u
007 cr cn-
008 071228s2002 nyua sb 001 0 eng d
020 $a 0306469146 (electronic bk.)
035 $a ocm50174970
040 $a N $c N $d OCLCQ
049 $a AMFA
050 1 4 $a TA418.7 $b .B43 2002eb
082 0 4 $a 620/.44 $2 21
245 0 0 $a Beam effects, surface topography, and depth profiling in surface analysis $h [electronic resource] / $c edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell.
260 $a New York : $c c2002. $b Kluwer Academic,
300 $a xix, 430 p. : $b ill. ; $c 24 cm.
440 0 $a Methods of surface characterization ; $v v. 5
504 $a Includes bibliographical references and index.
533 $a Electronic reproduction. $b Boulder, Colo. : $c NetLibrary, $d 2002. $n Available via World Wide Web. $n Access may be limited to NetLibrary affiliated libraries.
650 $a Materials $x Effect of radiation on. $3 673011
650 $a Surfaces (Technology) $x Analysis. $3 592671
655 $a Electronic books. $2 lcsh $3 542853
700 $a Czanderna, Alvin Warren, $d 1930- $3 866315
700 $a Madey, Theodore E. $3 866316
700 $a Powell, C. J. $q (Cedric John) $3 866317
710 $a NetLibrary, Inc. $3 542851
776 1 $c Original $z 0306458969
856 4 $3 Bibliographic record display $u http://www.netLibrary.com/urlapi.asp?action=summary&v=1&bookid=67545 $z An electronic book accessible through the World Wide Web; click for information
994 $a 92 $b AMF