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World class reliability = using Mult...

Bhote, Adi K.

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World class reliability = using Multiple Environment Overstress Tests to make it happen /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	World class reliability/ Keki R. Bhote and Adi K. Bhote.
其他題名:	using Multiple Environment Overstress Tests to make it happen /
作者:	Bhote, Keki R.,
其他作者:	Bhote, Adi K.
出版者:	New York :American Management Association, : c2004.,
面頁冊數:	xix, 218 p. :ill. ;24 cm.
標題:	Reliability (Engineering) -
電子資源:	http://www.netLibrary.com/urlapi.asp?action=summary&v=1&bookid=109482An electronic book accessible through the World Wide Web; click for information
ISBN:	0814427995 (electronic bk.)

World class reliability = using Multiple Environment Overstress Tests to make it happen /
Bhote, Keki R.,1925-

World class reliabilityusing Multiple Environment Overstress Tests to make it happen /[electronic resource] :Keki R. Bhote and Adi K. Bhote. - New York :American Management Association,c2004. - xix, 218 p. :ill. ;24 cm.

Includes bibliographical references (p. 209-210) and index.

Electronic reproduction.
Boulder, Colo. :
NetLibrary,
2004.

Available via World Wide Web.

ISBN: 0814427995 (electronic bk.)Subjects--Topical Terms:

647853
Reliability (Engineering)
Index Terms--Genre/Form:

542853
Electronic books.

LC Class. No.: TA169 / .B48 2004eb

Dewey Class. No.: 620/.00452

World class reliability = using Multiple Environment Overstress Tests to make it happen /
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