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Foreign participation in U.S. resear...

Reid, Proctor P.

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Foreign participation in U.S. research and development = asset or liability?/

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Foreign participation in U.S. research and development/ Proctor P. Reid and Alan Schriesheim, editors ; Committee on Foreign Participation in U.S. Research and Development, National Academy of Engineering.
其他題名:	asset or liability?/
其他題名:	Foreign participation in United States research and development
其他作者:	Reid, Proctor P.
出版者:	Washington, D.C. :National Academy Press, : 1996.,
面頁冊數:	viii, 194 p. :ill., map ;23 cm.
叢書名:	Series on prospering in a global economy
標題:	Investments, Foreign - United States. -
電子資源:	http://www.netlibrary.com/urlapi.asp?action=summary&v=1&bookid=733An electronic book accessible through the World Wide Web; click for information
ISBN:	0585023999 (electronic bk.)

Foreign participation in U.S. research and development = asset or liability?/
Foreign participation in U.S. research and developmentasset or liability?/[electronic resource] :Foreign participation in United States research and developmentProctor P. Reid and Alan Schriesheim, editors ; Committee on Foreign Participation in U.S. Research and Development, National Academy of Engineering. - Washington, D.C. :National Academy Press,1996. - viii, 194 p. :ill., map ;23 cm. - Series on prospering in a global economy.

Includes bibliographical references (p. 159-171) and index.

Electronic reproduction.
Boulder, Colo. :
NetLibrary,
1999.

Available via the World Wide Web.

ISBN: 0585023999 (electronic bk.)Subjects--Topical Terms:

646629
Investments, Foreign
--United States.Index Terms--Genre/Form:

542853
Electronic books.

LC Class. No.: HG4910 / .F68 1996eb

Dewey Class. No.: 332.6/73/0973

Foreign participation in U.S. research and development = asset or liability?/
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245 0 0 $a Foreign participation in U.S. research and development $h [electronic resource] : $b asset or liability?/ $c Proctor P. Reid and Alan Schriesheim, editors ; Committee on Foreign Participation in U.S. Research and Development, National Academy of Engineering.
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300 $a viii, 194 p. : $b ill., map ; $c 23 cm.
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