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2006 International Symposium on VLSI...

Gong ye ji shu yan jiu yuan.

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2006 International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT).. [1],. proceedings of technical papers : April 26-28, 2006, Ambassador Hotel Hsinchu, Taiwan /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	2006 International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT)./ Industrial Technology Research Institute, IEEE, TSIA.
其他題名:	International Symposium on VLSI Design, Automation & Test.
團體作者:	International Symposium on VLSI Design, Automation, and Test
出版者:	Hsinchu, Taiwan :ERSO/ITRI, : c2006.,
面頁冊數:	[7], 303, iv p. :ill. ;30 cm.
附註:	"IEEE catalog number: 06TH8869."
標題:	Integrated circuits - Congresses. - Very large scale integration -
電子資源:	http://ieeexplore.ieee.org/xpl/RecentCon.jsp?punumber=10013http://ieeexplore.ieee.org/xpl/RecentCon.jsp?punumber=10013
ISBN:	1424401798 (pbk.)

2006 International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT).. [1],. proceedings of technical papers : April 26-28, 2006, Ambassador Hotel Hsinchu, Taiwan /
2006 International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT).[1],proceedings of technical papers : April 26-28, 2006, Ambassador Hotel Hsinchu, Taiwan /International Symposium on VLSI Design, Automation & Test.Industrial Technology Research Institute, IEEE, TSIA. - Hsinchu, Taiwan :ERSO/ITRI,c2006. - [7], 303, iv p. :ill. ;30 cm.

"IEEE catalog number: 06TH8869."

Includes bibliographical references.

ISBN: 1424401798 (pbk.)Subjects--Topical Terms:

586339
Integrated circuits
--Very large scale integration--Congresses.

Dewey Class. No.: 621.39/5

2006 International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT).. [1],. proceedings of technical papers : April 26-28, 2006, Ambassador Hotel Hsinchu, Taiwan /
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