碳化矽邊緣終結結構之摻雜濃度梯度效應之模擬 = = Simulation...
林暐智

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  • 碳化矽邊緣終結結構之摻雜濃度梯度效應之模擬 = = Simulation of doping concentration gradient effect on silicon carbide edge termination structure /
  • Record Type: Language materials, printed : Monograph/item
    Title/Author: 碳化矽邊緣終結結構之摻雜濃度梯度效應之模擬 =/ 林暐智撰
    Reminder of title: Simulation of doping concentration gradient effect on silicon carbide edge termination structure /
    remainder title: Simulation of doping concentration gradient effect on silicon carbide edge termination structure
    Author: 林暐智
    other author: 劉耿銘
    Published: 花蓮縣 :國立東華大學電機工程學系, : 2023,
    Description: 82面 :圖,表 ;30公分
    Notes: 校內電子全文開放日期:2025/11/23
    Subject: 4H-SiC -
    Online resource: http://134.208.29.108/cgi-bin/gs32/gsweb.cgi?o=dstdcdr&s=G0610923015.id&searchmode=basic電子全文(依作者授權而定)
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GE0220709 五樓論文區 (5F Theses & Dissertations) 03.不外借_N 本校碩士論文 T 448.6 4468 2023 一般使用(Normal) On shelf 0
  • 1 records • Pages 1 •
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