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Recent advances in microelectronics ...

Driel, W. D. van.

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Recent advances in microelectronics reliability = contributions from the European ECSEL JU project iRel40 /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Recent advances in microelectronics reliability/ edited by Willem Dirk van Driel, Klaus Pressel, Mujdat Soyturk.
其他題名:	contributions from the European ECSEL JU project iRel40 /
其他作者:	Driel, W. D. van.
出版者:	Cham :Springer International Publishing : : 2024.,
面頁冊數:	xiii, 403 p. :ill. (some col.), digital ;24 cm.
內容註:	Chapter 1. Material characterization -- Chapter 2. Smart optical inline metrology -- Chapter 3. Automated classification of semiconductor defect density SEM images using deep learning -- Chapter 4. An Artificial Intelligence-based Framework for Burn-in Reduction in the Semiconductor Manufacturing Industry -- Chapter 5. An Artificial Intelligence-based Framework for Burn-in Reduction in the Semiconductor Manufacturing Industry -- Chapter 6. Early Lifetime Estimation for Automotive Lidar using Realistic L4 Usage Profiles -- Chapter 7. Improving the reliability of automotive sensors -- Chapter 8. Reliability improvements for in-wheel motor -- Chapter 9. Big Data Streaming and Data Analytics Infrastructure for Efficient AI-Based Processing -- Chapter 10. An Outlook on Power Electronics Reliability and Reliability Monitoring -- Chapter 11. Digital Twin Technology in Electronics -- Chapter 12. A Framework for Applying Data-driven AI/ML Models in Reliability. Chapter 13. Health monitoring fatigue properties of solder Interconnects in LED drivers -- Chapter 14. Compiling Hybrid Models for embedded architectures using TensorflowLite for Microcontrollers -- Chapter 15. Design support for reliable integrated circuits -- Chapter 16. Outlook: the future of reliability.
Contained By:	Springer Nature eBook
標題:	Microelectronics - Reliability. -
電子資源:	https://doi.org/10.1007/978-3-031-59361-1
ISBN:	9783031593611

Recent advances in microelectronics reliability = contributions from the European ECSEL JU project iRel40 /
Recent advances in microelectronics reliabilitycontributions from the European ECSEL JU project iRel40 /[electronic resource] :edited by Willem Dirk van Driel, Klaus Pressel, Mujdat Soyturk. - Cham :Springer International Publishing :2024. - xiii, 403 p. :ill. (some col.), digital ;24 cm.

Chapter 1. Material characterization -- Chapter 2. Smart optical inline metrology -- Chapter 3. Automated classification of semiconductor defect density SEM images using deep learning -- Chapter 4. An Artificial Intelligence-based Framework for Burn-in Reduction in the Semiconductor Manufacturing Industry -- Chapter 5. An Artificial Intelligence-based Framework for Burn-in Reduction in the Semiconductor Manufacturing Industry -- Chapter 6. Early Lifetime Estimation for Automotive Lidar using Realistic L4 Usage Profiles -- Chapter 7. Improving the reliability of automotive sensors -- Chapter 8. Reliability improvements for in-wheel motor -- Chapter 9. Big Data Streaming and Data Analytics Infrastructure for Efficient AI-Based Processing -- Chapter 10. An Outlook on Power Electronics Reliability and Reliability Monitoring -- Chapter 11. Digital Twin Technology in Electronics -- Chapter 12. A Framework for Applying Data-driven AI/ML Models in Reliability. Chapter 13. Health monitoring fatigue properties of solder Interconnects in LED drivers -- Chapter 14. Compiling Hybrid Models for embedded architectures using TensorflowLite for Microcontrollers -- Chapter 15. Design support for reliable integrated circuits -- Chapter 16. Outlook: the future of reliability.

This book describes the latest progress in reliability analysis of microelectronic products. The content grows out of an EU project, named Intelligent Reliability 4.0 - iRel40 (see www.irel40.eu ) Different industrial sectors and topics are covered, such as electronics in automotive, rail transport, lighting and personal appliances. Several case studies and examples are discussed, which will enable readers to assess and mitigate similar failure cases. More importantly, this book tries to present methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of electronic devices. Describes state-of-the-art methodologies for analyzing the reliability, failure, and degradation of electronic devices; Discusses how to correlate electronic processing and performance to reliability and lifetime; Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of electronic devices.

ISBN: 9783031593611

Standard No.: 10.1007/978-3-031-59361-1doiSubjects--Topical Terms:

3722805
Microelectronics
--Reliability.

LC Class. No.: TK7874

Dewey Class. No.: 621.381

Recent advances in microelectronics reliability = contributions from the European ECSEL JU project iRel40 /
LDR:03308nmm a2200325 a 4500 001 2374152
003 DE-He213
005 20240712125408.0
006 m d
007 cr nn 008maaau
008 241231s2024 sz s 0 eng d
020 $a 9783031593611 $q (electronic bk.)
020 $a 9783031593604 $q (paper)
024 7 $a 10.1007/978-3-031-59361-1 $2 doi
035 $a 978-3-031-59361-1
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7874
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.381 $2 23
090 $a TK7874 $b .R295 2024
245 0 0 $a Recent advances in microelectronics reliability $h [electronic resource] : $b contributions from the European ECSEL JU project iRel40 / $c edited by Willem Dirk van Driel, Klaus Pressel, Mujdat Soyturk.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2024.
300 $a xiii, 403 p. : $b ill. (some col.), digital ; $c 24 cm.
505 0 $a Chapter 1. Material characterization -- Chapter 2. Smart optical inline metrology -- Chapter 3. Automated classification of semiconductor defect density SEM images using deep learning -- Chapter 4. An Artificial Intelligence-based Framework for Burn-in Reduction in the Semiconductor Manufacturing Industry -- Chapter 5. An Artificial Intelligence-based Framework for Burn-in Reduction in the Semiconductor Manufacturing Industry -- Chapter 6. Early Lifetime Estimation for Automotive Lidar using Realistic L4 Usage Profiles -- Chapter 7. Improving the reliability of automotive sensors -- Chapter 8. Reliability improvements for in-wheel motor -- Chapter 9. Big Data Streaming and Data Analytics Infrastructure for Efficient AI-Based Processing -- Chapter 10. An Outlook on Power Electronics Reliability and Reliability Monitoring -- Chapter 11. Digital Twin Technology in Electronics -- Chapter 12. A Framework for Applying Data-driven AI/ML Models in Reliability. Chapter 13. Health monitoring fatigue properties of solder Interconnects in LED drivers -- Chapter 14. Compiling Hybrid Models for embedded architectures using TensorflowLite for Microcontrollers -- Chapter 15. Design support for reliable integrated circuits -- Chapter 16. Outlook: the future of reliability.
520 $a This book describes the latest progress in reliability analysis of microelectronic products. The content grows out of an EU project, named Intelligent Reliability 4.0 - iRel40 (see www.irel40.eu ) Different industrial sectors and topics are covered, such as electronics in automotive, rail transport, lighting and personal appliances. Several case studies and examples are discussed, which will enable readers to assess and mitigate similar failure cases. More importantly, this book tries to present methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of electronic devices. Describes state-of-the-art methodologies for analyzing the reliability, failure, and degradation of electronic devices; Discusses how to correlate electronic processing and performance to reliability and lifetime; Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of electronic devices.
650 0 $a Microelectronics $x Reliability. $3 3722805
650 1 4 $a Electronic Circuits and Systems. $3 3538814
650 2 4 $a Electronics Design and Verification. $3 3592716
650 2 4 $a Electronic Devices. $3 3538495
700 1 $a Driel, W. D. van. $3 3722802
700 1 $a Pressel, Klaus. $3 3722803
700 1 $a Soyturk, Mujdat. $3 3722804
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer Nature eBook
856 4 0 $u https://doi.org/10.1007/978-3-031-59361-1
950 $a Engineering (SpringerNature-11647)