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Structural decision diagrams in digital test = theory and applications /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Structural decision diagrams in digital test/ by Raimund Ubar ... [et al.].
Reminder of title:	theory and applications /
other author:	Ubar, Raimund.
Published:	Cham :Springer Nature Switzerland : : 2024.,
Description:	xiii, 595 p. :ill. (some col.), digital ;24 cm.
[NT 15003449]:	Chapter 1: Introduction -- Chapter 2: Overview of structural decision diagrams -- Chapter 3: Structurally Synthesized Binary Decision Diagrams -- Chapter 4: Fault modeling in digital circuits -- Chapter 5: Logic-level fault simulation -- Chapter 6: Test generation, fault diagnosis and testability -- Chapter 7: High-Level Decision Diagrams -- Chapter 8: Test generation for microprocessors with HLDDs.
Contained By:	Springer Nature eBook
Subject:	Digital electronics - Testing. -
Online resource:	https://doi.org/10.1007/978-3-031-44734-1
ISBN:	9783031447341

Structural decision diagrams in digital test = theory and applications /
Structural decision diagrams in digital testtheory and applications /[electronic resource] :by Raimund Ubar ... [et al.]. - Cham :Springer Nature Switzerland :2024. - xiii, 595 p. :ill. (some col.), digital ;24 cm. - Computer science foundations and applied logic,2731-5762. - Computer science foundations and applied logic..

Chapter 1: Introduction -- Chapter 2: Overview of structural decision diagrams -- Chapter 3: Structurally Synthesized Binary Decision Diagrams -- Chapter 4: Fault modeling in digital circuits -- Chapter 5: Logic-level fault simulation -- Chapter 6: Test generation, fault diagnosis and testability -- Chapter 7: High-Level Decision Diagrams -- Chapter 8: Test generation for microprocessors with HLDDs.

This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research. The book introduces and discusses applications of two types of structural decision diagrams (DDs): low-level, structurally synthesized binary DDs (SSBDDs) and high-level DDs (HLDDs) that enable diagnostic modeling of complex digital circuits and systems. Topics and features: Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDs Provides numerous working examples that illustrate the key points of the text Describes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generation Discusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representations Combines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasks This unique book is aimed at researchers working in the fields of computer science and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses. Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia: Raimund Ubar is a retired Professor, Jaan Raik and Maksim Jenihhin are tenured Professors. Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia.

ISBN: 9783031447341

Standard No.: 10.1007/978-3-031-44734-1doiSubjects--Topical Terms:

654036
Digital electronics
--Testing.

LC Class. No.: TK7868.D5

Dewey Class. No.: 621.381548

Structural decision diagrams in digital test = theory and applications /
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245 0 0 $a Structural decision diagrams in digital test $h [electronic resource] : $b theory and applications / $c by Raimund Ubar ... [et al.].
260 $a Cham : $b Springer Nature Switzerland : $b Imprint: Birkhäuser, $c 2024.
300 $a xiii, 595 p. : $b ill. (some col.), digital ; $c 24 cm.
490 1 $a Computer science foundations and applied logic, $x 2731-5762
505 0 $a Chapter 1: Introduction -- Chapter 2: Overview of structural decision diagrams -- Chapter 3: Structurally Synthesized Binary Decision Diagrams -- Chapter 4: Fault modeling in digital circuits -- Chapter 5: Logic-level fault simulation -- Chapter 6: Test generation, fault diagnosis and testability -- Chapter 7: High-Level Decision Diagrams -- Chapter 8: Test generation for microprocessors with HLDDs.
520 $a This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research. The book introduces and discusses applications of two types of structural decision diagrams (DDs): low-level, structurally synthesized binary DDs (SSBDDs) and high-level DDs (HLDDs) that enable diagnostic modeling of complex digital circuits and systems. Topics and features: Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDs Provides numerous working examples that illustrate the key points of the text Describes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generation Discusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representations Combines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasks This unique book is aimed at researchers working in the fields of computer science and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses. Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia: Raimund Ubar is a retired Professor, Jaan Raik and Maksim Jenihhin are tenured Professors. Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia.
650 0 $a Digital electronics $x Testing. $3 654036
650 0 $a Electric fault location $x Simulation methods. $3 3712565
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650 2 4 $a Computer Science Logic and Foundations of Programming. $3 3538531
650 2 4 $a Electronic Circuits and Systems. $3 3538814
650 2 4 $a Operations Research and Decision Theory. $3 3591727
700 1 $a Ubar, Raimund. $3 3712564
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer Nature eBook
830 0 $a Computer science foundations and applied logic. $3 3625395
856 4 0 $u https://doi.org/10.1007/978-3-031-44734-1
950 $a Computer Science (SpringerNature-11645)