Machine learning support for fault d...
Girard, Patrick.

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  • Machine learning support for fault diagnosis of System-on-Chip
  • 紀錄類型: 書目-電子資源 : Monograph/item
    正題名/作者: Machine learning support for fault diagnosis of System-on-Chip/ edited by Patrick Girard, Shawn Blanton, Li-C. Wang.
    其他作者: Girard, Patrick.
    出版者: Cham :Springer International Publishing : : 2023.,
    面頁冊數: xi, 316 p. :ill., digital ;24 cm.
    內容註: Introduction -- Prerequisites on Fault Diagnosis -- Conventional Methods for Fault Diagnosis -- Machine Learning and Its Applications in Test -- Machine Learning Support for Logic Diagnosis -- Machine Learning Support for Cell-Aware Diagnosis -- Machine Learning Support for Volume Diagnosis -- Machine Learning Support for Diagnosis of Analog Circuits -- Machine Learning Support for Board-level Functional Fault Diagnosis -- Machine Learning Support for Wafer-level Failure Cluster Identification -- Conclusion.
    Contained By: Springer Nature eBook
    標題: Electric fault location. -
    電子資源: https://doi.org/10.1007/978-3-031-19639-3
    ISBN: 9783031196393
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W9453692 電子資源 11.線上閱覽_V 電子書 EB TK3226 .M33 2023 一般使用(Normal) 在架 0
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