東華大學圖書館 |

語系: 繁體中文

說明(常見問題)

回圖書館首頁

手機版館藏查詢

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Thin films = processes and character...

Nedelcu, Nicoleta.

FindBook

Google Book

Amazon

博客來

Thin films = processes and characterization techniques /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Thin films/ by Nicoleta Nedelcu.
其他題名:	processes and characterization techniques /
作者:	Nedelcu, Nicoleta.
出版者:	Cham :Springer International Publishing : : 2023.,
面頁冊數:	x, 124 p. :ill., digital ;24 cm.
內容註:	Chapter 1. Introduction -- Chapter 2. Thin layer method -- Chapter 3. Vacuum thin film deposition installation -- Chapter 4. Method for characterizing thin layer -- Chapter 5. Study of optical and chemical properties.
Contained By:	Springer Nature eBook
標題:	Thin films. -
電子資源:	https://doi.org/10.1007/978-3-031-06616-0
ISBN:	9783031066160

Thin films = processes and characterization techniques /
Nedelcu, Nicoleta.

Thin filmsprocesses and characterization techniques /[electronic resource] :by Nicoleta Nedelcu. - Cham :Springer International Publishing :2023. - x, 124 p. :ill., digital ;24 cm.

Chapter 1. Introduction -- Chapter 2. Thin layer method -- Chapter 3. Vacuum thin film deposition installation -- Chapter 4. Method for characterizing thin layer -- Chapter 5. Study of optical and chemical properties.

The book provides research scientists and engineers in industry information and data on the materials processing, characterization, and determination of materials' physical-chemical properties. The book highlights optical and chemical properties obtained on novel materials using a range of deposition methods by two different spectroscopic techniques: SE and UV-VIS-NIR. Emphasizing applications from across a number of domains including Healthcare, Opto-Electronic, and Defense, the book is ideal for academic researchers, graduate/undergraduate students, and practicing engineers concerned with optical coating technologies. Describes creation of new materials thermal evaporation, sputtering, electrochemical and chemical-vacuum deposition; Explains a technology for material evaporation, uniformity calculation, thickness measurement and layer characterization; Highlights the correlation of optical and chemical properties obtained from spectroscopic methods.

ISBN: 9783031066160

Standard No.: 10.1007/978-3-031-06616-0doiSubjects--Topical Terms:

626403
Thin films.

LC Class. No.: TA418.9.T45 / N44 2023

Dewey Class. No.: 621.38152

Thin films = processes and characterization techniques /
LDR:02180nmm a2200325 a 4500 001 2316895
003 DE-He213
005 20230406153652.0
006 m d
007 cr nn 008maaau
008 230902s2023 sz s 0 eng d
020 $a 9783031066160 $q (electronic bk.)
020 $a 9783031066153 $q (paper)
024 7 $a 10.1007/978-3-031-06616-0 $2 doi
035 $a 978-3-031-06616-0
040 $a GP $c GP
041 0 $a eng
050 4 $a TA418.9.T45 $b N44 2023
072 7 $a TGM $2 bicssc
072 7 $a TEC021040 $2 bisacsh
072 7 $a TGM $2 thema
082 0 4 $a 621.38152 $2 23
090 $a TA418.9.T45 $b N371 2023
100 1 $a Nedelcu, Nicoleta. $3 3630488
245 1 0 $a Thin films $h [electronic resource] : $b processes and characterization techniques / $c by Nicoleta Nedelcu.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2023.
300 $a x, 124 p. : $b ill., digital ; $c 24 cm.
505 0 $a Chapter 1. Introduction -- Chapter 2. Thin layer method -- Chapter 3. Vacuum thin film deposition installation -- Chapter 4. Method for characterizing thin layer -- Chapter 5. Study of optical and chemical properties.
520 $a The book provides research scientists and engineers in industry information and data on the materials processing, characterization, and determination of materials' physical-chemical properties. The book highlights optical and chemical properties obtained on novel materials using a range of deposition methods by two different spectroscopic techniques: SE and UV-VIS-NIR. Emphasizing applications from across a number of domains including Healthcare, Opto-Electronic, and Defense, the book is ideal for academic researchers, graduate/undergraduate students, and practicing engineers concerned with optical coating technologies. Describes creation of new materials thermal evaporation, sputtering, electrochemical and chemical-vacuum deposition; Explains a technology for material evaporation, uniformity calculation, thickness measurement and layer characterization; Highlights the correlation of optical and chemical properties obtained from spectroscopic methods.
650 0 $a Thin films. $3 626403
650 1 4 $a Surfaces, Interfaces and Thin Film. $3 3593580
650 2 4 $a Materials Characterization Technique. $3 3591940
650 2 4 $a Process Engineering. $3 3591945
650 2 4 $a Materials Engineering. $3 2071625
650 2 4 $a Materials for Devices. $3 3591876
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer Nature eBook
856 4 0 $u https://doi.org/10.1007/978-3-031-06616-0
950 $a Chemistry and Materials Science (SpringerNature-11644)