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Advanced laser diode reliability

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Vanzi, Massimo.

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Advanced laser diode reliability

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Advanced laser diode reliability/ Massimo Vanzi, Laurent Béchou, Mitsuo Fukuda, Giovanna Mura.
作者:	Vanzi, Massimo.
其他作者:	Béchou, Laurent.
出版者:	London, UK :ISTE Press ; : 2020.,
面頁冊數:	1 online resource.
內容註:	1. Laser Diode Reliability 2. Multi-Component Model for Semiconductor Laser Degradation 3. Reliability of Laser Diodes for High-Rate Optical Communications - A Monte Carlo-Based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions 4. Laser Diode Characteristics 5. Laser Diode DC Measurement Protocols.
標題:	Diodes, Semiconductor - Reliability. -
電子資源:	https://www.sciencedirect.com/science/book/9781785481543
ISBN:	9780081010891 (electronic bk.)

Advanced laser diode reliability
Vanzi, Massimo.

Advanced laser diode reliability[electronic resource] /Massimo Vanzi, Laurent Béchou, Mitsuo Fukuda, Giovanna Mura. - London, UK :ISTE Press ;2020. - 1 online resource.

1. Laser Diode Reliability 2. Multi-Component Model for Semiconductor Laser Degradation 3. Reliability of Laser Diodes for High-Rate Optical Communications - A Monte Carlo-Based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions 4. Laser Diode Characteristics 5. Laser Diode DC Measurement Protocols.

ISBN: 9780081010891 (electronic bk.)

Nat. Bib. No.: GBB7B5448bnbSubjects--Topical Terms:

3614918
Diodes, Semiconductor
--Reliability.Index Terms--Genre/Form:

542853
Electronic books.

LC Class. No.: TK7871.86

Dewey Class. No.: 621.381522

Advanced laser diode reliability
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020 $a 9781785481543 (hbk.)
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040 $a StDuBDS $b eng $c StDuBDS $d Uk
041 0 $a eng
050 4 $a TK7871.86
082 0 4 $a 621.381522 $2 23
100 1 $a Vanzi, Massimo. $3 3614915
245 1 0 $a Advanced laser diode reliability $h [electronic resource] / $c Massimo Vanzi, Laurent Béchou, Mitsuo Fukuda, Giovanna Mura.
260 $a London, UK : $b ISTE Press ; $a Oxford, UK - Elsevier, $c 2020.
300 $a 1 online resource.
505 0 $a 1. Laser Diode Reliability 2. Multi-Component Model for Semiconductor Laser Degradation 3. Reliability of Laser Diodes for High-Rate Optical Communications - A Monte Carlo-Based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions 4. Laser Diode Characteristics 5. Laser Diode DC Measurement Protocols.
650 0 $a Diodes, Semiconductor $x Reliability. $3 3614918
655 4 $a Electronic books. $2 lcsh $3 542853
700 1 $a Béchou, Laurent. $3 3614916
700 1 $a Fukuda, Mitsuo. $3 710730
700 1 $a Mura, Giovanna. $3 3614917
856 4 0 $u https://www.sciencedirect.com/science/book/9781785481543

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