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Multispectral In-Field Sensors Obser...
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Mississippi State University., Agricultural and Biological Engineering.
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Multispectral In-Field Sensors Observations to Estimate Corn Leaf Nitrogen Concentration and Grain Yield Using Machine Learning.
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Multispectral In-Field Sensors Observations to Estimate Corn Leaf Nitrogen Concentration and Grain Yield Using Machine Learning./
作者:
Barzin, Razieh.
出版者:
Ann Arbor : ProQuest Dissertations & Theses, : 2021,
面頁冊數:
103 p.
附註:
Source: Dissertations Abstracts International, Volume: 82-12, Section: B.
Contained By:
Dissertations Abstracts International82-12B.
標題:
Agricultural engineering. -
電子資源:
https://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=28414971
ISBN:
9798515203856
Multispectral In-Field Sensors Observations to Estimate Corn Leaf Nitrogen Concentration and Grain Yield Using Machine Learning.
Barzin, Razieh.
Multispectral In-Field Sensors Observations to Estimate Corn Leaf Nitrogen Concentration and Grain Yield Using Machine Learning.
- Ann Arbor : ProQuest Dissertations & Theses, 2021 - 103 p.
Source: Dissertations Abstracts International, Volume: 82-12, Section: B.
Thesis (Ph.D.)--Mississippi State University, 2021.
This item must not be sold to any third party vendors.
Nitrogen (N) is the most critical fertilizer applied nutrient for supporting plant growth. It is a critical part of photosynthesis as a component of chlorophyl, hence it is a key indicator of plant health. In recent years, rapid development of multispectral sensing technology and machine learning (ML) methods make it possible to estimate leaf chemical components such as N for predicting yield spatially and temporally. The objectives of this study were to compare the relationships between canopy reflectance and corn (Zea mays L.) leaf N concentration acquired by two multispectral sensors: red-edge multispectral camera mounted on the Unmanned Aerial Vehicle (UAV) and crop circle ACS-430. Four fertilizer N rates were applied, ranging from deficient to excessive in order to have a broad range in plant N status. Spectral information was collected at different phenological stages of corn to calculate vegetation indices (VIs) for each stage. Moreover, leaf samples were taken simultaneously to determine N concentration. Different ML methods (Multi-Layer Perceptron (MLP), Support Vector Machines (SVMs), Random Forest regression, Regularized regression models, and Gradient Boosting) were used to estimate leaf N% from VIs and predict yield from VIs. Random Forest Regression was utilized as a feature selection method to choose the best combination of variables for different stages and to interpret the relationships between VIs and corn leaf N concentration and grain yield. The Canopy Chlorophyll Content Index (SCCCI) and Red-edge Ratio Vegetation Index (RERVI) were selected as the most efficient VIs in leaf N estimation and SCCCI, Red-edge chlorophyll index (CIRE), RERVI, Soil Adjusted Vegetation Index (SAVI), and Normalized Difference Vegetation Index (NDVI) were chosen as the most effective VIs in predicting corn grain yield. The results derived from using a red-edge multispectral camera showed that the SCCCI was the most proper index for predicting yield at most of the phenological stages and Gradient Boosting was the best-fitted model to estimate leaf N% with an 80% coefficient of determination. Using a Crop Circle ACS-430 showed that the Support Vector Regression (SVR) model achieved the best performance measures than other models tested in the prediction of leaf N concentration.
ISBN: 9798515203856Subjects--Topical Terms:
3168406
Agricultural engineering.
Subjects--Index Terms:
Corn
Multispectral In-Field Sensors Observations to Estimate Corn Leaf Nitrogen Concentration and Grain Yield Using Machine Learning.
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Nitrogen (N) is the most critical fertilizer applied nutrient for supporting plant growth. It is a critical part of photosynthesis as a component of chlorophyl, hence it is a key indicator of plant health. In recent years, rapid development of multispectral sensing technology and machine learning (ML) methods make it possible to estimate leaf chemical components such as N for predicting yield spatially and temporally. The objectives of this study were to compare the relationships between canopy reflectance and corn (Zea mays L.) leaf N concentration acquired by two multispectral sensors: red-edge multispectral camera mounted on the Unmanned Aerial Vehicle (UAV) and crop circle ACS-430. Four fertilizer N rates were applied, ranging from deficient to excessive in order to have a broad range in plant N status. Spectral information was collected at different phenological stages of corn to calculate vegetation indices (VIs) for each stage. Moreover, leaf samples were taken simultaneously to determine N concentration. Different ML methods (Multi-Layer Perceptron (MLP), Support Vector Machines (SVMs), Random Forest regression, Regularized regression models, and Gradient Boosting) were used to estimate leaf N% from VIs and predict yield from VIs. Random Forest Regression was utilized as a feature selection method to choose the best combination of variables for different stages and to interpret the relationships between VIs and corn leaf N concentration and grain yield. The Canopy Chlorophyll Content Index (SCCCI) and Red-edge Ratio Vegetation Index (RERVI) were selected as the most efficient VIs in leaf N estimation and SCCCI, Red-edge chlorophyll index (CIRE), RERVI, Soil Adjusted Vegetation Index (SAVI), and Normalized Difference Vegetation Index (NDVI) were chosen as the most effective VIs in predicting corn grain yield. The results derived from using a red-edge multispectral camera showed that the SCCCI was the most proper index for predicting yield at most of the phenological stages and Gradient Boosting was the best-fitted model to estimate leaf N% with an 80% coefficient of determination. Using a Crop Circle ACS-430 showed that the Support Vector Regression (SVR) model achieved the best performance measures than other models tested in the prediction of leaf N concentration.
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https://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=28414971
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