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Structural, syntactic, and statistic...

International Workshop on Structural and Syntactic Pattern Recognition ((2021 :)

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Structural, syntactic, and statistical pattern recognition = joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021 : proceedings /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Structural, syntactic, and statistical pattern recognition/ edited by Andrea Torsello ... [et al.].
其他題名:	joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021 : proceedings /
其他題名:	S+SSPR 2020
其他作者:	Torsello, Andrea.
團體作者:	International Workshop on Structural and Syntactic Pattern Recognition
出版者:	Cham :Springer International Publishing : : 2021.,
面頁冊數:	xii, 378 p. :ill., digital ;24 cm.
內容註:	Classification and data processing -- Deep learning -- Graph-theoretic methods -- Multimedia analysis and understanding.
Contained By:	Springer Nature eBook
標題:	Pattern recognition systems - Congresses. -
電子資源:	https://doi.org/10.1007/978-3-030-73973-7
ISBN:	9783030739737

Structural, syntactic, and statistical pattern recognition = joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021 : proceedings /
Structural, syntactic, and statistical pattern recognitionjoint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021 : proceedings /[electronic resource] :S+SSPR 2020edited by Andrea Torsello ... [et al.]. - Cham :Springer International Publishing :2021. - xii, 378 p. :ill., digital ;24 cm. - Lecture notes in computer science,126440302-9743 ;. - Lecture notes in computer science ;12644..

Classification and data processing -- Deep learning -- Graph-theoretic methods -- Multimedia analysis and understanding.

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021. The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions. The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.

ISBN: 9783030739737

Standard No.: 10.1007/978-3-030-73973-7doiSubjects--Topical Terms:

563039
Pattern recognition systems
--Congresses.

LC Class. No.: TK7882.P3 / I57 2021

Dewey Class. No.: 006.4

Structural, syntactic, and statistical pattern recognition = joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021 : proceedings /
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