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Soft error reliability of VLSI circu...
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Ghavami, Behnam.
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Soft error reliability of VLSI circuits = analysis and mitigation techniques /
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Soft error reliability of VLSI circuits/ by Behnam Ghavami, Mohsen Raji.
其他題名:
analysis and mitigation techniques /
作者:
Ghavami, Behnam.
其他作者:
Raji, Mohsen.
出版者:
Cham :Springer International Publishing : : 2021.,
面頁冊數:
xiii, 114 p. :ill., digital ;24 cm.
內容註:
Introduction: Soft Error Modeling -- Soft Error Rate Estimation of VLSI circuits -- Process Variation Aware Soft Error Rate Estimation Method for Integrated Circuits -- GPU-Accelerated Soft Error Rate Analysis of Large-scale Integrated Circuits -- FPGA Hardware Acceleration of Soft Error Rate Estimation of Digital Circuits -- Soft Error Tolerant Circuit Design using Partitioning-based Gate Sizing -- Resynthesize Technique for Soft Error Tolerant Design of Combinational Circuits.
Contained By:
Springer Nature eBook
標題:
Integrated circuits - Very large scale integration. -
電子資源:
https://doi.org/10.1007/978-3-030-51610-9
ISBN:
9783030516109
Soft error reliability of VLSI circuits = analysis and mitigation techniques /
Ghavami, Behnam.
Soft error reliability of VLSI circuits
analysis and mitigation techniques /[electronic resource] :by Behnam Ghavami, Mohsen Raji. - Cham :Springer International Publishing :2021. - xiii, 114 p. :ill., digital ;24 cm.
Introduction: Soft Error Modeling -- Soft Error Rate Estimation of VLSI circuits -- Process Variation Aware Soft Error Rate Estimation Method for Integrated Circuits -- GPU-Accelerated Soft Error Rate Analysis of Large-scale Integrated Circuits -- FPGA Hardware Acceleration of Soft Error Rate Estimation of Digital Circuits -- Soft Error Tolerant Circuit Design using Partitioning-based Gate Sizing -- Resynthesize Technique for Soft Error Tolerant Design of Combinational Circuits.
This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today's reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques. Provides an accessible, comprehensive introduction to soft errors; Describes an easy to follow procedure for modeling, analysis, and estimation of soft error rate of digital circuits; Includes state-of-the art soft error aware CAD algorithms; Describes practical soft error aware synthesis techniques for commercial large-scale VLSI designs.
ISBN: 9783030516109
Standard No.: 10.1007/978-3-030-51610-9doiSubjects--Topical Terms:
535389
Integrated circuits
--Very large scale integration.
LC Class. No.: TK7888.4 / .G43 2021
Dewey Class. No.: 621.3815
Soft error reliability of VLSI circuits = analysis and mitigation techniques /
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Introduction: Soft Error Modeling -- Soft Error Rate Estimation of VLSI circuits -- Process Variation Aware Soft Error Rate Estimation Method for Integrated Circuits -- GPU-Accelerated Soft Error Rate Analysis of Large-scale Integrated Circuits -- FPGA Hardware Acceleration of Soft Error Rate Estimation of Digital Circuits -- Soft Error Tolerant Circuit Design using Partitioning-based Gate Sizing -- Resynthesize Technique for Soft Error Tolerant Design of Combinational Circuits.
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