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Advances in VLSI and embedded system...
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International Conference on Advances in VLSI and Embedded Systems ((2019 :)
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Advances in VLSI and embedded systems = select proceedings of AVES 2019 /
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Advances in VLSI and embedded systems/ edited by Zuber Patel, Shilpi Gupta, Nithin Kumar Y. B.
其他題名:
select proceedings of AVES 2019 /
其他題名:
AVES 2019
其他作者:
Patel, Zuber.
團體作者:
International Conference on Advances in VLSI and Embedded Systems
出版者:
Singapore :Springer Singapore : : 2021.,
面頁冊數:
xix, 299 p. :ill., digital ;24 cm.
內容註:
Automated simulator for the validation of bio-impedance devices -- Analysis of Memory-Based Real Fast Fourier Transform Architectures for Low-Area Applications -- Optimization of MEMS-Based Capacitive Sensor with High-k dielectric for Detection of Heavy Metal Ions -- Statistical Analysis of Vehicle Detection in the ITS application for monitoring the traffic and road accident using Internet of Things -- Hamiltonian Mechanics -- FPGA design of SAR type ADC based analog input module for industrial applications -- FPGA Based Implementation of Artifact Suppression and Feature Extraction -- Test Time Reduction using Power Aware Dynamic Clock Allocation to Scan Vectors -- Impact of Spacers in Raised Source/Drain 14 nm technology node.
Contained By:
Springer Nature eBook
標題:
Integrated circuits - Congresses. - Very large scale integration -
電子資源:
https://doi.org/10.1007/978-981-15-6229-7
ISBN:
9789811562297
Advances in VLSI and embedded systems = select proceedings of AVES 2019 /
Advances in VLSI and embedded systems
select proceedings of AVES 2019 /[electronic resource] :AVES 2019edited by Zuber Patel, Shilpi Gupta, Nithin Kumar Y. B. - Singapore :Springer Singapore :2021. - xix, 299 p. :ill., digital ;24 cm. - Lecture notes in electrical engineering,v.6761876-1100 ;. - Lecture notes in electrical engineering ;v.676..
Automated simulator for the validation of bio-impedance devices -- Analysis of Memory-Based Real Fast Fourier Transform Architectures for Low-Area Applications -- Optimization of MEMS-Based Capacitive Sensor with High-k dielectric for Detection of Heavy Metal Ions -- Statistical Analysis of Vehicle Detection in the ITS application for monitoring the traffic and road accident using Internet of Things -- Hamiltonian Mechanics -- FPGA design of SAR type ADC based analog input module for industrial applications -- FPGA Based Implementation of Artifact Suppression and Feature Extraction -- Test Time Reduction using Power Aware Dynamic Clock Allocation to Scan Vectors -- Impact of Spacers in Raised Source/Drain 14 nm technology node.
This book presents select peer-reviewed proceedings of the International Conference on Advances in VLSI and Embedded Systems (AVES 2019) held at SVNIT, Surat, Gujarat, India. The book covers cutting-edge original research in VLSI design, devices and emerging technologies, embedded systems, and CAD for VLSI. With an aim to address the demand for complex and high-functionality systems as well as portable consumer electronics, the contents focus on basic concepts of circuit and systems design, fabrication, testing, and standardization. This book can be useful for students, researchers as well as industry professionals interested in emerging trends in VLSI and embedded systems.
ISBN: 9789811562297
Standard No.: 10.1007/978-981-15-6229-7doiSubjects--Topical Terms:
586339
Integrated circuits
--Very large scale integration--Congresses.
LC Class. No.: TK7874 / .I57 2019
Dewey Class. No.: 621.395
Advances in VLSI and embedded systems = select proceedings of AVES 2019 /
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Automated simulator for the validation of bio-impedance devices -- Analysis of Memory-Based Real Fast Fourier Transform Architectures for Low-Area Applications -- Optimization of MEMS-Based Capacitive Sensor with High-k dielectric for Detection of Heavy Metal Ions -- Statistical Analysis of Vehicle Detection in the ITS application for monitoring the traffic and road accident using Internet of Things -- Hamiltonian Mechanics -- FPGA design of SAR type ADC based analog input module for industrial applications -- FPGA Based Implementation of Artifact Suppression and Feature Extraction -- Test Time Reduction using Power Aware Dynamic Clock Allocation to Scan Vectors -- Impact of Spacers in Raised Source/Drain 14 nm technology node.
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