東華大學圖書館 |

語系: 繁體中文

說明(常見問題)

回圖書館首頁

手機版館藏查詢

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Ageing of integrated circuits = caus...

Halak, Basel.

FindBook

Google Book

Amazon

博客來

Ageing of integrated circuits = causes, effects and mitigation techniques /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Ageing of integrated circuits/ edited by Basel Halak.
其他題名:	causes, effects and mitigation techniques /
其他作者:	Halak, Basel.
出版者:	Cham :Springer International Publishing : : 2020.,
面頁冊數:	xiii, 228 p. :ill., digital ;24 cm.
內容註:	Chapter 1. Understanding Ageing Mechanisms -- Chapter 2. The Effects of Ageing on the reliability and performance of Integrated Circuits -- Chapter 3. Ageing Mitigation Techniques for Microprocessors using using Anti- Ageing Software -- Chapter 4. Ageing Mitigation Techniques for SRAM Memories -- Chapter 5. Ageing-aware Logic Synthesis -- Chapter 6. On-Chip Ageing Monitoring and System Adaptation -- Chapter 7. Aging Monitors for SRAM Memory Cells and Sense Amplifiers -- Chapter 8. A Cost-Efficient Aging Sensor based on Multiple Paths Delay Fault Monitoring.
Contained By:	Springer eBooks
標題:	Integrated circuits. -
電子資源:	https://doi.org/10.1007/978-3-030-23781-3
ISBN:	9783030237813

Ageing of integrated circuits = causes, effects and mitigation techniques /
Ageing of integrated circuitscauses, effects and mitigation techniques /[electronic resource] :edited by Basel Halak. - Cham :Springer International Publishing :2020. - xiii, 228 p. :ill., digital ;24 cm.

Chapter 1. Understanding Ageing Mechanisms -- Chapter 2. The Effects of Ageing on the reliability and performance of Integrated Circuits -- Chapter 3. Ageing Mitigation Techniques for Microprocessors using using Anti- Ageing Software -- Chapter 4. Ageing Mitigation Techniques for SRAM Memories -- Chapter 5. Ageing-aware Logic Synthesis -- Chapter 6. On-Chip Ageing Monitoring and System Adaptation -- Chapter 7. Aging Monitors for SRAM Memory Cells and Sense Amplifiers -- Chapter 8. A Cost-Efficient Aging Sensor based on Multiple Paths Delay Fault Monitoring.

This book provides comprehensive coverage of the latest research into integrated circuits' ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits. Describes in detail the physical mechanisms of CMOS ageing; Provides an in-depth discussion on the impact of ageing on the performance and reliability of integrated circuits; Presents state-of-the art synthesis algorithms for ageing resilient digital systems; Introduces application-dependent techniques to mitigate the effects of aging; Discusses the design and implementation of on-chip aging monitoring sensors for aging-adaptable systems; Includes more than 200 references on state-of-art research in this area, providing direction for further reading.

ISBN: 9783030237813

Standard No.: 10.1007/978-3-030-23781-3doiSubjects--Topical Terms:

584067
Integrated circuits.

LC Class. No.: TA7874

Dewey Class. No.: 621.3815

Ageing of integrated circuits = causes, effects and mitigation techniques /
LDR:02350nmm a2200325 a 4500 001 2213897
003 DE-He213
005 20200224142358.0
006 m d
007 cr nn 008maaau
008 201118s2020 sz s 0 eng d
020 $a 9783030237813 $q (electronic bk.)
020 $a 9783030237806 $q (paper)
024 7 $a 10.1007/978-3-030-23781-3 $2 doi
035 $a 978-3-030-23781-3
040 $a GP $c GP
041 0 $a eng
050 4 $a TA7874
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.3815 $2 23
090 $a TA7874 $b .A265 2020
245 0 0 $a Ageing of integrated circuits $h [electronic resource] : $b causes, effects and mitigation techniques / $c edited by Basel Halak.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2020.
300 $a xiii, 228 p. : $b ill., digital ; $c 24 cm.
505 0 $a Chapter 1. Understanding Ageing Mechanisms -- Chapter 2. The Effects of Ageing on the reliability and performance of Integrated Circuits -- Chapter 3. Ageing Mitigation Techniques for Microprocessors using using Anti- Ageing Software -- Chapter 4. Ageing Mitigation Techniques for SRAM Memories -- Chapter 5. Ageing-aware Logic Synthesis -- Chapter 6. On-Chip Ageing Monitoring and System Adaptation -- Chapter 7. Aging Monitors for SRAM Memory Cells and Sense Amplifiers -- Chapter 8. A Cost-Efficient Aging Sensor based on Multiple Paths Delay Fault Monitoring.
520 $a This book provides comprehensive coverage of the latest research into integrated circuits' ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits. Describes in detail the physical mechanisms of CMOS ageing; Provides an in-depth discussion on the impact of ageing on the performance and reliability of integrated circuits; Presents state-of-the art synthesis algorithms for ageing resilient digital systems; Introduces application-dependent techniques to mitigate the effects of aging; Discusses the design and implementation of on-chip aging monitoring sensors for aging-adaptable systems; Includes more than 200 references on state-of-art research in this area, providing direction for further reading.
650 0 $a Integrated circuits. $3 584067
650 1 4 $a Circuits and Systems. $3 896527
650 2 4 $a Processor Architectures. $3 892680
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 893838
700 1 $a Halak, Basel. $3 3321500
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer eBooks
856 4 0 $u https://doi.org/10.1007/978-3-030-23781-3
950 $a Engineering (Springer-11647)