Language:
English
繁體中文
Help
回圖書館首頁
手機版館藏查詢
Login
Back
Switch To:
Labeled
|
MARC Mode
|
ISBD
Machine learning in VLSI computer-ai...
~
Elfadel, Ibrahim (Abe) M.
Linked to FindBook
Google Book
Amazon
博客來
Machine learning in VLSI computer-aided design
Record Type:
Electronic resources : Monograph/item
Title/Author:
Machine learning in VLSI computer-aided design/ edited by Ibrahim (Abe) M. Elfadel, Duane S. Boning, Xin Li.
other author:
Elfadel, Ibrahim (Abe) M.
Published:
Cham :Springer International Publishing : : 2019.,
Description:
xxii, 694 p. :ill., digital ;24 cm.
[NT 15003449]:
Chapter1: A Preliminary Taxonomy for Machine Learning in VLSI CAD -- Chapter2: Machine Learning for Compact Lithographic Process Models -- Chapter3: Machine Learning for Mask Synthesis -- Chapter4: Machine Learning in Physical Verification, Mask Synthesis, and Physical Design -- Chapter5: Gaussian Process-Based Wafer-Level Correlation Modeling and its Applications -- Chapter6: Machine Learning Approaches for IC Manufacturing Yield Enhancement -- Chapter7: Efficient Process Variation Characterization by Virtual Probe -- Chapter8: Machine learning for VLSI chip testing and semiconductor manufacturing process monitoring and improvement -- Chapter9: Machine Learning based Aging Analysis -- Chapter10: Extreme Statistics in Memories -- Chapter11: Fast Statistical Analysis Using Machine Learning -- Chapter12: Fast Statistical Analysis of Rare Circuit Failure Events -- Chapter13: Learning from Limited Data in VLSI CAD -- Chapter14: Large-Scale Circuit Performance Modeling by Bayesian Model Fusion -- Chapter15: Sparse Relevance Kernel Machine Based Performance Dependency Analysis of Analog and Mixed-Signal Circuits -- Chapter16: SiLVR: Projection Pursuit for Response Surface Modeling -- Chapter17: Machine Learning based System Optimization and Uncertainty Quantification of Integrated Systems -- Chapter18: SynTunSys: A Synthesis Parameter Autotuning System for Optimizing High-Performance Processors -- Chapter19: Multicore Power and Thermal Proxies Using Least-Angle -- Chapter20: A Comparative Study of Assertion Mining Algorithms in GoldMine -- Chapter21: Energy-Efficient Design of Advanced Machine Learning Hardware.
Contained By:
Springer eBooks
Subject:
Integrated circuits - Very large scale integration -
Online resource:
https://doi.org/10.1007/978-3-030-04666-8
ISBN:
9783030046668
Machine learning in VLSI computer-aided design
Machine learning in VLSI computer-aided design
[electronic resource] /edited by Ibrahim (Abe) M. Elfadel, Duane S. Boning, Xin Li. - Cham :Springer International Publishing :2019. - xxii, 694 p. :ill., digital ;24 cm.
Chapter1: A Preliminary Taxonomy for Machine Learning in VLSI CAD -- Chapter2: Machine Learning for Compact Lithographic Process Models -- Chapter3: Machine Learning for Mask Synthesis -- Chapter4: Machine Learning in Physical Verification, Mask Synthesis, and Physical Design -- Chapter5: Gaussian Process-Based Wafer-Level Correlation Modeling and its Applications -- Chapter6: Machine Learning Approaches for IC Manufacturing Yield Enhancement -- Chapter7: Efficient Process Variation Characterization by Virtual Probe -- Chapter8: Machine learning for VLSI chip testing and semiconductor manufacturing process monitoring and improvement -- Chapter9: Machine Learning based Aging Analysis -- Chapter10: Extreme Statistics in Memories -- Chapter11: Fast Statistical Analysis Using Machine Learning -- Chapter12: Fast Statistical Analysis of Rare Circuit Failure Events -- Chapter13: Learning from Limited Data in VLSI CAD -- Chapter14: Large-Scale Circuit Performance Modeling by Bayesian Model Fusion -- Chapter15: Sparse Relevance Kernel Machine Based Performance Dependency Analysis of Analog and Mixed-Signal Circuits -- Chapter16: SiLVR: Projection Pursuit for Response Surface Modeling -- Chapter17: Machine Learning based System Optimization and Uncertainty Quantification of Integrated Systems -- Chapter18: SynTunSys: A Synthesis Parameter Autotuning System for Optimizing High-Performance Processors -- Chapter19: Multicore Power and Thermal Proxies Using Least-Angle -- Chapter20: A Comparative Study of Assertion Mining Algorithms in GoldMine -- Chapter21: Energy-Efficient Design of Advanced Machine Learning Hardware.
ISBN: 9783030046668
Standard No.: 10.1007/978-3-030-04666-8doiSubjects--Topical Terms:
715562
Integrated circuits
--Very large scale integration
LC Class. No.: TK7874.75
Dewey Class. No.: 621.395
Machine learning in VLSI computer-aided design
LDR
:02603nmm a2200313 a 4500
001
2180512
003
DE-He213
005
20190315165652.0
006
m d
007
cr nn 008maaau
008
191122s2019 gw s 0 eng d
020
$a
9783030046668
$q
(electronic bk.)
020
$a
9783030046651
$q
(paper)
024
7
$a
10.1007/978-3-030-04666-8
$2
doi
035
$a
978-3-030-04666-8
040
$a
GP
$c
GP
041
0
$a
eng
050
4
$a
TK7874.75
072
7
$a
TJFC
$2
bicssc
072
7
$a
TEC008010
$2
bisacsh
072
7
$a
TJFC
$2
thema
082
0 4
$a
621.395
$2
23
090
$a
TK7874.75
$b
.M149 2019
245
0 0
$a
Machine learning in VLSI computer-aided design
$h
[electronic resource] /
$c
edited by Ibrahim (Abe) M. Elfadel, Duane S. Boning, Xin Li.
260
$a
Cham :
$b
Springer International Publishing :
$b
Imprint: Springer,
$c
2019.
300
$a
xxii, 694 p. :
$b
ill., digital ;
$c
24 cm.
505
0
$a
Chapter1: A Preliminary Taxonomy for Machine Learning in VLSI CAD -- Chapter2: Machine Learning for Compact Lithographic Process Models -- Chapter3: Machine Learning for Mask Synthesis -- Chapter4: Machine Learning in Physical Verification, Mask Synthesis, and Physical Design -- Chapter5: Gaussian Process-Based Wafer-Level Correlation Modeling and its Applications -- Chapter6: Machine Learning Approaches for IC Manufacturing Yield Enhancement -- Chapter7: Efficient Process Variation Characterization by Virtual Probe -- Chapter8: Machine learning for VLSI chip testing and semiconductor manufacturing process monitoring and improvement -- Chapter9: Machine Learning based Aging Analysis -- Chapter10: Extreme Statistics in Memories -- Chapter11: Fast Statistical Analysis Using Machine Learning -- Chapter12: Fast Statistical Analysis of Rare Circuit Failure Events -- Chapter13: Learning from Limited Data in VLSI CAD -- Chapter14: Large-Scale Circuit Performance Modeling by Bayesian Model Fusion -- Chapter15: Sparse Relevance Kernel Machine Based Performance Dependency Analysis of Analog and Mixed-Signal Circuits -- Chapter16: SiLVR: Projection Pursuit for Response Surface Modeling -- Chapter17: Machine Learning based System Optimization and Uncertainty Quantification of Integrated Systems -- Chapter18: SynTunSys: A Synthesis Parameter Autotuning System for Optimizing High-Performance Processors -- Chapter19: Multicore Power and Thermal Proxies Using Least-Angle -- Chapter20: A Comparative Study of Assertion Mining Algorithms in GoldMine -- Chapter21: Energy-Efficient Design of Advanced Machine Learning Hardware.
650
0
$a
Integrated circuits
$x
Very large scale integration
$x
Computer-aided design.
$3
715562
650
0
$a
Machine learning.
$3
533906
650
1 4
$a
Circuits and Systems.
$3
896527
650
2 4
$a
Processor Architectures.
$3
892680
650
2 4
$a
Logic Design.
$3
892735
700
1
$a
Elfadel, Ibrahim (Abe) M.
$3
3379541
700
1
$a
Boning, Duane S.
$3
3386647
700
1
$a
Li, Xin.
$3
999627
710
2
$a
SpringerLink (Online service)
$3
836513
773
0
$t
Springer eBooks
856
4 0
$u
https://doi.org/10.1007/978-3-030-04666-8
950
$a
Engineering (Springer-11647)
based on 0 review(s)
Location:
ALL
電子資源
Year:
Volume Number:
Items
1 records • Pages 1 •
1
Inventory Number
Location Name
Item Class
Material type
Call number
Usage Class
Loan Status
No. of reservations
Opac note
Attachments
W9370359
電子資源
11.線上閱覽_V
電子書
EB TK7874.75
一般使用(Normal)
On shelf
0
1 records • Pages 1 •
1
Multimedia
Reviews
Add a review
and share your thoughts with other readers
Export
pickup library
Processing
...
Change password
Login