Phase change memory = device physics...
Redaelli, Andrea.

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  • Phase change memory = device physics, reliability and applications /
  • 紀錄類型: 書目-電子資源 : Monograph/item
    正題名/作者: Phase change memory/ edited by Andrea Redaelli.
    其他題名: device physics, reliability and applications /
    其他作者: Redaelli, Andrea.
    出版者: Cham :Springer International Publishing : : 2018.,
    面頁冊數: xviii, 330 p. :ill., digital ;24 cm.
    內容註: Chapter 1. Memory overview and PCM introduction -- Chapter 2.Electrical transport in crystalline and amorphous chalcogenides -- Chapter 3.Thermal model and remarkable temperature effects on calcogenide alloys -- Chapter 4.Self-consistent numerical model -- Chapter 5.PCM main reliability features -- Chapter 6.Structure and properties of chalcogenide materials for PCM -- Chapter 7.Material Engineering for PCM Device Optimization -- Chapter 8.PCM scaling -- Chapter 9.PCM device design -- Chapter 10.PCM array architecture and management -- Chapter 11. PCM applications and an outlook to the future.
    Contained By: Springer eBooks
    標題: Phase change memory. -
    電子資源: http://dx.doi.org/10.1007/978-3-319-69053-7
    ISBN: 9783319690537
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