東華大學圖書館 |

語系: 繁體中文

說明(常見問題)

回圖書館首頁

手機版館藏查詢

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

LabVIEW based automation guide for m...

Dubey, Satya Kesh.

FindBook

Google Book

Amazon

博客來

LabVIEW based automation guide for microwave measurements

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	LabVIEW based automation guide for microwave measurements/ by Satya Kesh Dubey ... [et al.].
其他作者:	Dubey, Satya Kesh.
出版者:	Singapore :Springer Singapore : : 2018.,
面頁冊數:	xiv, 45 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	Microwave measurements - Automation. -
電子資源:	http://dx.doi.org/10.1007/978-981-10-6280-3
ISBN:	9789811062803

LabVIEW based automation guide for microwave measurements
LabVIEW based automation guide for microwave measurements[electronic resource] /by Satya Kesh Dubey ... [et al.]. - Singapore :Springer Singapore :2018. - xiv, 45 p. :ill., digital ;24 cm. - SpringerBriefs in electrical and computer engineering,2191-8112. - SpringerBriefs in electrical and computer engineering..

The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC)

ISBN: 9789811062803

Standard No.: 10.1007/978-981-10-6280-3doiSubjects--Topical Terms:

3297627
Microwave measurements
--Automation.

LC Class. No.: TK7876

Dewey Class. No.: 681.2

LabVIEW based automation guide for microwave measurements
LDR:02328nmm a2200325 a 4500 001 2131752
003 DE-He213
005 20180620104139.0
006 m d
007 cr nn 008maaau
008 181005s2018 si s 0 eng d
020 $a 9789811062803 $q (electronic bk.)
020 $a 9789811062797 $q (paper)
024 7 $a 10.1007/978-981-10-6280-3 $2 doi
035 $a 978-981-10-6280-3
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7876
072 7 $a TJFN $2 bicssc
072 7 $a TEC024000 $2 bisacsh
072 7 $a TEC030000 $2 bisacsh
082 0 4 $a 681.2 $2 23
090 $a TK7876 $b .L127 2018
245 0 0 $a LabVIEW based automation guide for microwave measurements $h [electronic resource] / $c by Satya Kesh Dubey ... [et al.].
260 $a Singapore : $b Springer Singapore : $b Imprint: Springer, $c 2018.
300 $a xiv, 45 p. : $b ill., digital ; $c 24 cm.
490 1 $a SpringerBriefs in electrical and computer engineering, $x 2191-8112
520 $a The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC)
650 0 $a Microwave measurements $x Automation. $3 3297627
650 1 4 $a Engineering. $3 586835
650 2 4 $a Microwaves, RF and Optical Engineering. $3 893985
650 2 4 $a Numerical and Computational Physics, Simulation. $3 2209853
650 2 4 $a Communications Engineering, Networks. $3 891094
700 1 $a Dubey, Satya Kesh. $3 3297626
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer eBooks
830 0 $a SpringerBriefs in electrical and computer engineering. $3 1565565
856 4 0 $u http://dx.doi.org/10.1007/978-981-10-6280-3
950 $a Engineering (Springer-11647)