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I. Measuring and Reducing Stress and...
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Antonakos, Cory Dale.
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I. Measuring and Reducing Stress and Surface Roughness in IBAD MgO Films and II. Developing Tools to Measure Transfer in Undergraduate Chemistry Students.
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
I. Measuring and Reducing Stress and Surface Roughness in IBAD MgO Films and II. Developing Tools to Measure Transfer in Undergraduate Chemistry Students./
作者:
Antonakos, Cory Dale.
出版者:
Ann Arbor : ProQuest Dissertations & Theses, : 2016,
面頁冊數:
108 p.
附註:
Source: Dissertation Abstracts International, Volume: 78-07(E), Section: B.
Contained By:
Dissertation Abstracts International78-07B(E).
標題:
Physical chemistry. -
電子資源:
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=10192482
ISBN:
9781369558937
I. Measuring and Reducing Stress and Surface Roughness in IBAD MgO Films and II. Developing Tools to Measure Transfer in Undergraduate Chemistry Students.
Antonakos, Cory Dale.
I. Measuring and Reducing Stress and Surface Roughness in IBAD MgO Films and II. Developing Tools to Measure Transfer in Undergraduate Chemistry Students.
- Ann Arbor : ProQuest Dissertations & Theses, 2016 - 108 p.
Source: Dissertation Abstracts International, Volume: 78-07(E), Section: B.
Thesis (Ph.D.)--University of California, Berkeley, 2016.
I. MgO may be grown with a biaxial texture onto an amorphous substrate with the use of ion beam assisted deposition (IBAD). This MgO film may then be used as a platform on which to grow epitaxial films on an amorphous membrane for characterization purposes. However, the IBAD MgO film is stressed, causing buckles in the amorphous membrane and problems with further film growth on the IBAD MgO. This dissertation work explores the source of this film stress and develops methods to relax the stress and reduce surface roughness with annealing and increased growth temperature. It is determined that annealing and increased growth temperature coupled with a higher ion-to-atom ratio (IAR) during film growth reduce stress and surface roughness sufficiently to use even thinner IBAD MgO films as an intermediate layer between an amorphous membrane and epitaxial film.
ISBN: 9781369558937Subjects--Topical Terms:
1981412
Physical chemistry.
I. Measuring and Reducing Stress and Surface Roughness in IBAD MgO Films and II. Developing Tools to Measure Transfer in Undergraduate Chemistry Students.
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I. MgO may be grown with a biaxial texture onto an amorphous substrate with the use of ion beam assisted deposition (IBAD). This MgO film may then be used as a platform on which to grow epitaxial films on an amorphous membrane for characterization purposes. However, the IBAD MgO film is stressed, causing buckles in the amorphous membrane and problems with further film growth on the IBAD MgO. This dissertation work explores the source of this film stress and develops methods to relax the stress and reduce surface roughness with annealing and increased growth temperature. It is determined that annealing and increased growth temperature coupled with a higher ion-to-atom ratio (IAR) during film growth reduce stress and surface roughness sufficiently to use even thinner IBAD MgO films as an intermediate layer between an amorphous membrane and epitaxial film.
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II. Much of the existing literature on knowledge transfer concludes that transfer is rare and does not occur spontaneously. However, studies supporting that transfer is rare often use methods that focus on binary success or failure to solve a problem correctly and do not analyze thought process. This dissertation work aims at developing transfer questions that allow open-ended responses, developing a method of analysis for these responses that looks for transfer in the problem-solving process, and assessing the methodology itself and its sensitivity, validity, and utility as a general transfer measurement technique for use across a broad range of expertise levels in chemistry.
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