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Advanced transmission electron micro...

Zuo, Jian Min.

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Advanced transmission electron microscopy = imaging and diffraction in nanoscience /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Advanced transmission electron microscopy/ by Jian Min Zuo, John C.H. Spence.
其他題名:	imaging and diffraction in nanoscience /
作者:	Zuo, Jian Min.
其他作者:	Spence, John C.H.
出版者:	New York, NY :Springer New York : : 2017.,
面頁冊數:	xxvi, 729 p. :ill. (some col.), digital ;24 cm.
內容註:	Introduction and historical background -- Electron Waves and Wave Propagation -- The geometry of electron diffraction patterns -- Kinematical Theory of Electron Diffraction -- Dynamical Theory of Electron Diffraction for Perfect Crystals -- Electron optics -- Lens aberrations and Aberration Correction -- Electron Sources -- Electron Detectors -- Instrumentation and experimental techniques -- Crystal symmetry -- Crystal structure and bonding -- Diffuse Scattering -- Atomic resolution electron imaging -- Imaging and characterization of crystal defects -- Strain Measurements and Mapping -- Structure of Nanocrystals, Nanoparticles and Nanotubes.
Contained By:	Springer eBooks
標題:	Transmission electron microscopy. -
電子資源:	http://dx.doi.org/10.1007/978-1-4939-6607-3
ISBN:	9781493966073

Advanced transmission electron microscopy = imaging and diffraction in nanoscience /
Zuo, Jian Min.

Advanced transmission electron microscopyimaging and diffraction in nanoscience /[electronic resource] :by Jian Min Zuo, John C.H. Spence. - New York, NY :Springer New York :2017. - xxvi, 729 p. :ill. (some col.), digital ;24 cm.

Introduction and historical background -- Electron Waves and Wave Propagation -- The geometry of electron diffraction patterns -- Kinematical Theory of Electron Diffraction -- Dynamical Theory of Electron Diffraction for Perfect Crystals -- Electron optics -- Lens aberrations and Aberration Correction -- Electron Sources -- Electron Detectors -- Instrumentation and experimental techniques -- Crystal symmetry -- Crystal structure and bonding -- Diffuse Scattering -- Atomic resolution electron imaging -- Imaging and characterization of crystal defects -- Strain Measurements and Mapping -- Structure of Nanocrystals, Nanoparticles and Nanotubes.

This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the applications of electron diffraction from single crystals as well as general structure analysis of single crystals, powders, and nanostructures. Advanced Transmission Electron Microscopy provides a comprehensive treatment of theory and practice, and is written at a level suitable for advanced undergraduate students and graduate students and researchers in materials science, chemistry, and physics. Practical guides are provided for interpretation and simulation of electron diffraction patterns.

ISBN: 9781493966073

Standard No.: 10.1007/978-1-4939-6607-3doiSubjects--Topical Terms:

567074
Transmission electron microscopy.

LC Class. No.: TA404.6

Dewey Class. No.: 502.825

Advanced transmission electron microscopy = imaging and diffraction in nanoscience /
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