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Dispersion measurement for on-chip m...

Chen, Steven.

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Dispersion measurement for on-chip microresonator.

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Dispersion measurement for on-chip microresonator./
作者:	Chen, Steven.
面頁冊數:	52 p.
附註:	Source: Masters Abstracts International, Volume: 55-02.
Contained By:	Masters Abstracts International55-02(E).
標題:	Optics. -
電子資源:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=1602638
ISBN:	9781339182810

Dispersion measurement for on-chip microresonator.
Chen, Steven.

Dispersion measurement for on-chip microresonator. - 52 p.

Source: Masters Abstracts International, Volume: 55-02.

Thesis (M.S.E.C.E.)--Purdue University, 2015.

The cavity dispersion is an important factor to the generation of microresonator frequency comb. In order to find the dispersion for micro ring, we measure the dispersion by beating a tunable laser with a mode locked laser frequency comb. The measurement takes less than 10 seconds to complete and has good accuracy. We developed the codes to process the raw data and calculate the cavity dispersion from the free spectral range evolution. From the experimental result, we were able to get to 10% uncertainty for the measurement on some micro-ring. In addition, we found that our measured dispersion match with the simulated value for a number of devices.

ISBN: 9781339182810Subjects--Topical Terms:

517925
Optics.

Dispersion measurement for on-chip microresonator.
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100 1 $a Chen, Steven. $3 3185854
245 1 0 $a Dispersion measurement for on-chip microresonator.
300 $a 52 p.
500 $a Source: Masters Abstracts International, Volume: 55-02.
500 $a Adviser: Andrew M. Weiner.
502 $a Thesis (M.S.E.C.E.)--Purdue University, 2015.
520 $a The cavity dispersion is an important factor to the generation of microresonator frequency comb. In order to find the dispersion for micro ring, we measure the dispersion by beating a tunable laser with a mode locked laser frequency comb. The measurement takes less than 10 seconds to complete and has good accuracy. We developed the codes to process the raw data and calculate the cavity dispersion from the free spectral range evolution. From the experimental result, we were able to get to 10% uncertainty for the measurement on some micro-ring. In addition, we found that our measured dispersion match with the simulated value for a number of devices.
590 $a School code: 0183.
650 4 $a Optics. $3 517925
690 $a 0752
710 2 $a Purdue University. $b Electrical and Computer Engineering. $3 1018497
773 0 $t Masters Abstracts International $g 55-02(E).
790 $a 0183
791 $a M.S.E.C.E.
792 $a 2015
793 $a English
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=1602638