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Characterization of Graphene Grown D...

Rothwell, Sara L.

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Characterization of Graphene Grown Directly on Crystalline Substrates.

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Characterization of Graphene Grown Directly on Crystalline Substrates./
作者:	Rothwell, Sara L.
面頁冊數:	129 p.
附註:	Source: Dissertation Abstracts International, Volume: 77-03(E), Section: B.
Contained By:	Dissertation Abstracts International77-03B(E).
標題:	Electrical engineering. -
電子資源:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3733295
ISBN:	9781339215693

Characterization of Graphene Grown Directly on Crystalline Substrates.
Rothwell, Sara L.

Characterization of Graphene Grown Directly on Crystalline Substrates. - 129 p.

Source: Dissertation Abstracts International, Volume: 77-03(E), Section: B.

Thesis (Ph.D.)--University of Minnesota, 2015.

Graphene has become one of the most popular materials under research, particularly since the 2010 Nobel Prize in Physics. Many visions posit that graphene electronics will be some of the fastest and smallest circuitry physically feasible, however before this becomes reality the scientific community must gain a firm handle on the creation of semiconducting varieties of graphene. In addition, well understood epitaxial growth of graphene on insulating materials will add to the facility of fabricating all-carbon electronics. This thesis presents experimental work detailing the growth of pristine graphene grown on sapphire (GOS) through the thermal decomposition of acetylene, and the electronic characterization of graphene grown on nitrogen-seeded silicon carbide (NG), a semiconducting variety of graphene grown in collaboration with researchers at Georgia Institute of Technology and Rutgers University. GOS displays turbostratic stacking and characteristics of monolayer graphene as analyzed by Raman spectroscopy and atomic force microscopy. Scanning tunneling microscopy characterization of NG illustrates a topography of pleats from 0.5-2 nm tall, 1-4 nm thick, and 1-20 nm long, as well as atomically flat plateaus and other areas of intermixed features. Scanning tunneling spectroscopy measurements across NG features show peaks interpreted as Landau levels induced by strain. Analysis of these Landau levels in coordination with previous characterization concludes that a model employing a bandgap fits best.

ISBN: 9781339215693Subjects--Topical Terms:

649834
Electrical engineering.

Characterization of Graphene Grown Directly on Crystalline Substrates.
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